Presentation 2009-11-19
High spatial resolution PL mapping of {11-22} InGaN quantum wells by a scanning near field optical microscope
Akio KANETA, Masaya UEDA, Mitsuru FUNATO, Yoichi KAWAKAMI,
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Abstract(in English) Spatially resolved photoluminescence mapping was performed for c plane and {11-22} InGaN/GaN quantum wells (QWs) by a scanning near field optical microscope, and differences of recombination dynamics between them were investigated at cryogenic temperature. For the c plane QW, despite the cryogenic temperature, the PL intensity map consists of island like structure where the strong PL intensity domains correspond to the lower emission energy bands. Moreover, the PL spectra are composed of several emission peaks, and the shape of spectra is different in each position. These results indicate that the carriers/excitons are diffused to localization centers and recombine radiatively. On the other hand, such PL intensity fluctuations and position dependence of PL spectra have not been observed in the {11-22} QW. These findings strongly suggest that the density of localization centers in the {11-22} QW is much higher than that in the c plane QW. Additionally, the carrier diffusion length of the {11-22} QW is much shorter than that of the c plane QW.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) c plane InGaN QW / {11-22}InGaN QW / scanning near field optical microscope / localization center / diffusion length
Paper # ED2009-135,CPM2009-109,LQE2009-114
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Conference Information
Committee LQE
Conference Date 2009/11/12(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High spatial resolution PL mapping of {11-22} InGaN quantum wells by a scanning near field optical microscope
Sub Title (in English)
Keyword(1) c plane InGaN QW
Keyword(2) {11-22}InGaN QW
Keyword(3) scanning near field optical microscope
Keyword(4) localization center
Keyword(5) diffusion length
1st Author's Name Akio KANETA
1st Author's Affiliation Department of Electronic Science and Engineering, Kyoto University()
2nd Author's Name Masaya UEDA
2nd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
3rd Author's Name Mitsuru FUNATO
3rd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
4th Author's Name Yoichi KAWAKAMI
4th Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
Date 2009-11-19
Paper # ED2009-135,CPM2009-109,LQE2009-114
Volume (vol) vol.109
Number (no) 290
Page pp.pp.-
#Pages 4
Date of Issue