Presentation | 2009-11-27 Debug Concern Graph for Supporting Test-Driven Development Masaru SHIOZUKA, Naoyasu UBAYASHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper proposes Debug Concern Graph (DCG), a knowledge representation method for aiding the debugging process based on Test-Driven Development. Many concerns such as source code revision information, the reason for code modifications, and referred documents are useful to fix a similar bug. However, it is not necessarily easy to reuse these concerns because they are scattered in repositories, source code comments, and memo documents. To deal with this problem, DCG manages these concerns in the form of graphs connecting related debug information. Using DCG, we can easily navigate a lot of debugging know-how. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Test-Driven Development / Debug / Concern Graph |
Paper # | KBSE2009-46 |
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Committee | KBSE |
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Conference Date | 2009/11/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Knowledge-Based Software Engineering (KBSE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Debug Concern Graph for Supporting Test-Driven Development |
Sub Title (in English) | |
Keyword(1) | Test-Driven Development |
Keyword(2) | Debug |
Keyword(3) | Concern Graph |
1st Author's Name | Masaru SHIOZUKA |
1st Author's Affiliation | Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology() |
2nd Author's Name | Naoyasu UBAYASHI |
2nd Author's Affiliation | Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology |
Date | 2009-11-27 |
Paper # | KBSE2009-46 |
Volume (vol) | vol.109 |
Number (no) | 307 |
Page | pp.pp.- |
#Pages | 6 |
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