Presentation 2009-11-27
Debug Concern Graph for Supporting Test-Driven Development
Masaru SHIOZUKA, Naoyasu UBAYASHI,
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Abstract(in English) This paper proposes Debug Concern Graph (DCG), a knowledge representation method for aiding the debugging process based on Test-Driven Development. Many concerns such as source code revision information, the reason for code modifications, and referred documents are useful to fix a similar bug. However, it is not necessarily easy to reuse these concerns because they are scattered in repositories, source code comments, and memo documents. To deal with this problem, DCG manages these concerns in the form of graphs connecting related debug information. Using DCG, we can easily navigate a lot of debugging know-how.
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Keyword(in English) Test-Driven Development / Debug / Concern Graph
Paper # KBSE2009-46
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Conference Information
Committee KBSE
Conference Date 2009/11/19(1days)
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Registration To Knowledge-Based Software Engineering (KBSE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Debug Concern Graph for Supporting Test-Driven Development
Sub Title (in English)
Keyword(1) Test-Driven Development
Keyword(2) Debug
Keyword(3) Concern Graph
1st Author's Name Masaru SHIOZUKA
1st Author's Affiliation Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology()
2nd Author's Name Naoyasu UBAYASHI
2nd Author's Affiliation Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
Date 2009-11-27
Paper # KBSE2009-46
Volume (vol) vol.109
Number (no) 307
Page pp.pp.-
#Pages 6
Date of Issue