Presentation | 2009-10-23 EMS Test Instrument with Stripline Structure Suitable for Applying High-Electric Field to Small Devices Erika KAWABATA, Koichi OGAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Recently, a great demand for the execution of EMC tests to electric small device products has increased. Although a TEM cell is commonly used in EMS tests for set assemblies it is difficult to apply a high electric field to a DUT, which is frequently required for small devices, since a large-scale power amplifier is needed for impressing such fields using a TEM cell commercially available. Thus, we have attempted to develop an EMS test instrument with stripline structure, which accommodates to small devices. The developed instrument enables us not only to apply a high electric field but also to provide a stable working environment and repeatability, resulting in the reduction of measurement time. Analytical and experimental considerations for the taperline structure have been carried out to achieve a wide frequency bandwidth operation required for the EMS test instrument. Over the entire frequency band up to 2GHz, an excellent impedance characteristic, less than -15dB return loss, has been successfully obtained. In addition, a high electric field was probed to be obtained under a low input electric power condition. Furthermore, we quantitatively evaluated the geometrical area where the uniform magnetic field was generated, and clarified the size of devices to be measured using the instrument. Finally, the physical mechanism responsible for the variation of magnetic fields is considered and a method for the reduction of the variation is proposed. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | EMC / TEM cell / Stripline / Taperline / Transmission line equation |
Paper # | EMCJ2009-63,MW2009-112 |
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Conference Information | |
Committee | MW |
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Conference Date | 2009/10/15(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Microwaves (MW) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | EMS Test Instrument with Stripline Structure Suitable for Applying High-Electric Field to Small Devices |
Sub Title (in English) | |
Keyword(1) | EMC |
Keyword(2) | TEM cell |
Keyword(3) | Stripline |
Keyword(4) | Taperline |
Keyword(5) | Transmission line equation |
1st Author's Name | Erika KAWABATA |
1st Author's Affiliation | Panasonic Photo & Lighting Co., Ltd.() |
2nd Author's Name | Koichi OGAWA |
2nd Author's Affiliation | Panasonic Co., Ltd. |
Date | 2009-10-23 |
Paper # | EMCJ2009-63,MW2009-112 |
Volume (vol) | vol.109 |
Number (no) | 242 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |