Presentation 2009-10-22
The Influence of Attached Lines for Electromagnetic Information Leakage from Information Devices
Kouhei OHMURA, Yu-ichi HAYASHI, Takaaki MIZUKI, Hideaki SONE,
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Abstract(in English) Recently, a lot of attack methods which target information leakage via electromagnetic emanation from information devices are developed, and causes real threats for information devices. Applying the EMI model to mechanism of the electromagnetic information leakage on information device, we can treat the transient current released from mounted modules as the Source; and the substrate of the device and the lines attached to the substrate as the Path and the Antenna. The authors showed a PCB and some attached lines in the information device behaves as band filter, but the mechanism is not clear. In this report the authors measure the influence of these circuit elements for frequency characteristic of the band filter focusing on inductance and capacitance of the attached lines. Our goals are giving clarified mechanism of the band filter and proposing guideline to suppress the electromagnetic information leakage from information devices.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Side-Cannel Attacks / Information Leakage / Electromagnetic Emanation
Paper # EMCJ2009-47,MW2009-96
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Conference Information
Committee EMCJ
Conference Date 2009/10/15(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The Influence of Attached Lines for Electromagnetic Information Leakage from Information Devices
Sub Title (in English)
Keyword(1) Side-Cannel Attacks
Keyword(2) Information Leakage
Keyword(3) Electromagnetic Emanation
1st Author's Name Kouhei OHMURA
1st Author's Affiliation Tohoku University()
2nd Author's Name Yu-ichi HAYASHI
2nd Author's Affiliation Tohoku University
3rd Author's Name Takaaki MIZUKI
3rd Author's Affiliation Tohoku University
4th Author's Name Hideaki SONE
4th Author's Affiliation Tohoku University
Date 2009-10-22
Paper # EMCJ2009-47,MW2009-96
Volume (vol) vol.109
Number (no) 241
Page pp.pp.-
#Pages 6
Date of Issue