| Presentation | 2009-10-15 Observation of fringelike electron emission patterns emitted from Pt field emitters fabricated by focused-ion-beam-induced deposition Katsuhisa MURAKAMI, Tomohito MATSUO, Fujio WAKAYA, Mikio TAKAI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Field emission properties and electron emission patterns of Pt filed emitters fabricated by focused-ion-beam-induced deposition (FIBID) were investigated by field emission microscopy (FEM). The field emission properties of Pt field emitters fabricated by FIBID were improved after several measurements, resulting in a high emission current of more than 10μA. The FEM image with fringelike electron emission patterns from Pt field emitters were observed after several measurements. The fringelike electron emission pattern was, further, in a good agreement with the simulated intensity profile of the superposition model of three interferences. These results indicated that the origin of the fringelike electron emission patterns was electron wave interference. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Focused Ion Beam Induced Deposition (FIBID) / Field Emission Microscopy (FEM) / Electron Wave Interference |
| Paper # | ED2009-120 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 2009/10/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Observation of fringelike electron emission patterns emitted from Pt field emitters fabricated by focused-ion-beam-induced deposition |
| Sub Title (in English) | |
| Keyword(1) | Focused Ion Beam Induced Deposition (FIBID) |
| Keyword(2) | Field Emission Microscopy (FEM) |
| Keyword(3) | Electron Wave Interference |
| 1st Author's Name | Katsuhisa MURAKAMI |
| 1st Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions, Osaka University() |
| 2nd Author's Name | Tomohito MATSUO |
| 2nd Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions, Osaka University |
| 3rd Author's Name | Fujio WAKAYA |
| 3rd Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions, Osaka University |
| 4th Author's Name | Mikio TAKAI |
| 4th Author's Affiliation | Center for Quantum Science and Technology under Extreme Conditions, Osaka University |
| Date | 2009-10-15 |
| Paper # | ED2009-120 |
| Volume (vol) | vol.109 |
| Number (no) | 230 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |