Presentation 2009-07-17
Study of stacked NAND type MRAM for universal memory
Shoto TAMAI, Shigeyoshi WATANABE,
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Abstract(in English) Study of stacked NAND type MRAM for universal memory has been described. Memory cell using surrounded write bit line which enable to use conventional write operation with magnetic field and small cell area of 9F^2 have been newly developed. Furthermore, optimized bias voltage scheme for the gate of selected and path memory cell has been adopted. Using these technology large stacked number of 64 more than that of flash memory and fast read time of less than 60ns have been realized.
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Keyword(in English) Non-volatile / MRAM / spin transistor / stacked NAND structure / universal memory
Paper # SDM2009-109,ICD2009-25
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Conference Information
Committee SDM
Conference Date 2009/7/9(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study of stacked NAND type MRAM for universal memory
Sub Title (in English)
Keyword(1) Non-volatile
Keyword(2) MRAM
Keyword(3) spin transistor
Keyword(4) stacked NAND structure
Keyword(5) universal memory
1st Author's Name Shoto TAMAI
1st Author's Affiliation Graduate school of Electrical and Information Engineering, Shonan Institute of Technology()
2nd Author's Name Shigeyoshi WATANABE
2nd Author's Affiliation Graduate school of Electrical and Information Engineering, Shonan Institute of Technology
Date 2009-07-17
Paper # SDM2009-109,ICD2009-25
Volume (vol) vol.109
Number (no) 133
Page pp.pp.-
#Pages 6
Date of Issue