| Presentation | 2009-09-25 Residual Uncertainty Evaluation in Vector Network Analyzer at RF frequency Masahiro HORIBE, Masaaki SHIDA, Koji Komiyama, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Air line are useful for the evaluations of residual elements in vector network analyzer measurements. However, air line length should be longer than the wavelength at the measurement frequencies in the evaluation methods using air line. Then, evaluation using air line cannot achieve the residual evaluation at RF frequencies. New evaluation methods using standard terminations with known-characteristics can calculate the residual elements and their uncertainties in VNA measurement at RF frequencies. According to this method, residual elements are vector values and then they can be corrected from VNA measurement results. The uncertainties of residual elements are calculated by propagation from uncertainties of standard terminations. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Vector network analyzer / Residual elements / Uncertainty / Standard terminations |
| Paper # | MW2009-78 |
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| Conference Information | |
| Committee | MW |
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| Conference Date | 2009/9/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Microwaves (MW) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Residual Uncertainty Evaluation in Vector Network Analyzer at RF frequency |
| Sub Title (in English) | |
| Keyword(1) | Vector network analyzer |
| Keyword(2) | Residual elements |
| Keyword(3) | Uncertainty |
| Keyword(4) | Standard terminations |
| 1st Author's Name | Masahiro HORIBE |
| 1st Author's Affiliation | National Institutes of Advanced Industrial Science and Technology, National Metrology Institutes of Japan() |
| 2nd Author's Name | Masaaki SHIDA |
| 2nd Author's Affiliation | National Institutes of Advanced Industrial Science and Technology, National Metrology Institutes of Japan |
| 3rd Author's Name | Koji Komiyama |
| 3rd Author's Affiliation | National Institutes of Advanced Industrial Science and Technology, National Metrology Institutes of Japan |
| Date | 2009-09-25 |
| Paper # | MW2009-78 |
| Volume (vol) | vol.109 |
| Number (no) | 210 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |