Presentation 2009-09-24
Comparison of Measurement Precision with CMOS and CCD Cameras : Influence on Industrial Vision Metrology
Susumu HATTORI, Yoshiyuki OHNISHI,
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Abstract(in English) In industrial vision metrology, off-the shelf cameras with known or unknown interior orientation parameters are widely employed. CCD which has long been used as an imaging sensor is now gradually replaced by CMOS. But the authors have often experienced the deterioration of measurement with a CMOS camera, the reason of which is unclear. This paper discusses experiments on precision comparison between the two types of cameras with almost the same conditions. The results show that the measurement precision with a CMOS camera is lower than that with a CCD camera by 5-10% in RMS object space coordinates. This paper discusses the experiment and analysis from viewpoint of respective factors.
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Keyword(in English) CMOS / CCD / Digital camera / Industrial vision / precision
Paper # LOIS2009-18,IE2009-59
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Committee LOIS
Conference Date 2009/9/17(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Comparison of Measurement Precision with CMOS and CCD Cameras : Influence on Industrial Vision Metrology
Sub Title (in English)
Keyword(1) CMOS
Keyword(2) CCD
Keyword(3) Digital camera
Keyword(4) Industrial vision
Keyword(5) precision
1st Author's Name Susumu HATTORI
1st Author's Affiliation Faculty of Engineering, Fukuyama University()
2nd Author's Name Yoshiyuki OHNISHI
2nd Author's Affiliation Vision Metrology Laboratory co. ltd
Date 2009-09-24
Paper # LOIS2009-18,IE2009-59
Volume (vol) vol.109
Number (no) 205
Page pp.pp.-
#Pages 5
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