Presentation 2009-06-26
Enhancement of the programming speed in SANOS nonvolatile memory device designed utilizing Al_2O_3 and SiO_2 stacked tunneling layers
H. W. Kim, D. H. Kim, J. H. You, T. W. Kim,
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Abstract(in English) The programming characteristics of polysilicon-aluminum oxide-nitride-oxide-silicon (SANOS) nonvolatile memory devices with Al_2O_3 and SiO_2 stacked tunneling layers were investigated. The electron and hole drifts in the Si_3N_4 layer were calculated to determine the program speed of the proposed SANOS devices by using the two band model taking into account Shockley-Reed statistics for the trap population, the continuity equation for the charge transport, and the Poisson equation for the electric field. Simulation results showed that enhancement of the programming speed in polysilicon-oxide-nitride-oxide-silicon was achieved by utilizing SiO_2 and Al_2O_3 stacked tunneling layers and the top Al_2O_3 blocking layer.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SANOS / SONOS / charge transport / silicon nitride / stacked tunneling layer
Paper # ED2009-98,SDM2009-93
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Committee SDM
Conference Date 2009/6/17(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Enhancement of the programming speed in SANOS nonvolatile memory device designed utilizing Al_2O_3 and SiO_2 stacked tunneling layers
Sub Title (in English)
Keyword(1) SANOS
Keyword(2) SONOS
Keyword(3) charge transport
Keyword(4) silicon nitride
Keyword(5) stacked tunneling layer
1st Author's Name H. W. Kim
1st Author's Affiliation Department of Nanoscale Semiconductor Engineering, Hanyang University()
2nd Author's Name D. H. Kim
2nd Author's Affiliation Division of Electronics and Computer Engineering, Hanyang University
3rd Author's Name J. H. You
3rd Author's Affiliation Division of Electronics and Computer Engineering, Hanyang University
4th Author's Name T. W. Kim
4th Author's Affiliation Department of Nanoscale Semiconductor Engineering, Hanyang University:Division of Electronics and Computer Engineering, Hanyang University
Date 2009-06-26
Paper # ED2009-98,SDM2009-93
Volume (vol) vol.109
Number (no) 98
Page pp.pp.-
#Pages 3
Date of Issue