| Presentation | 2009-06-26 Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory Yoon Kim, Seongjae Cho, Jang-Gn Yun, Il Han Park, Gil Sung Lee, Doo-Hyun Kim, Dong Hua Li, Se Hwan Park, Wandong Kim, Wonbo Shim, Byung-Gook Park, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The 3-dimensional folded NAND array having vertical channels has a large integration density and reliable memory characteristics without short channel effect. But, this kind of 3-D memory with vertical channels experiences inevitable interference between cells on both sides of a single silicon pillar, which is called PCI (Paired Cell Interference). As the thickness of silicon fin is scaled down, this phenomenon becomes severer. Consequently, the PCI is a crucial scaling restriction factor of vertical type flash memory. In this paper, we propose a multi-level reading method which utilizes PCI. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | NAND flash memory / 3-D array / PCI (Paired Cell Interference) |
| Paper # | ED2009-96,SDM2009-91 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 2009/6/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Multi-level reading method by using PCI (Paired Cell Interference) in vertical NAND flash memory |
| Sub Title (in English) | |
| Keyword(1) | NAND flash memory |
| Keyword(2) | 3-D array |
| Keyword(3) | PCI (Paired Cell Interference) |
| 1st Author's Name | Yoon Kim |
| 1st Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University() |
| 2nd Author's Name | Seongjae Cho |
| 2nd Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 3rd Author's Name | Jang-Gn Yun |
| 3rd Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 4th Author's Name | Il Han Park |
| 4th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 5th Author's Name | Gil Sung Lee |
| 5th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 6th Author's Name | Doo-Hyun Kim |
| 6th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 7th Author's Name | Dong Hua Li |
| 7th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 8th Author's Name | Se Hwan Park |
| 8th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 9th Author's Name | Wandong Kim |
| 9th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 10th Author's Name | Wonbo Shim |
| 10th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| 11th Author's Name | Byung-Gook Park |
| 11th Author's Affiliation | Inter-university Semiconductor Research Center:School of Electrical Engineering, Seoul National University |
| Date | 2009-06-26 |
| Paper # | ED2009-96,SDM2009-91 |
| Volume (vol) | vol.109 |
| Number (no) | 98 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |