Presentation 2009-06-26
Future High Density Memory with Vertical Structured Device Technology
Tetsuo Endoh,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) For the past thirty years, the downscaling has been the guiding principle in the field of High-density semiconductor memories. However, recently, the limit of planar-bulk MOSFETs is becoming apparent. Therefore, in order to extend the scalability of memory technology to the nano-scale generation; a new device structure is necessary. From the viewpoint, I will discuss future High density Memory with Vertical structured device technology.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Memory / Flash Memory / DRAM / 3D structure / Vertical Device / Stacked Vertical Device
Paper # ED2009-95,SDM2009-90
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Conference Information
Committee SDM
Conference Date 2009/6/17(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Future High Density Memory with Vertical Structured Device Technology
Sub Title (in English)
Keyword(1) Memory
Keyword(2) Flash Memory
Keyword(3) DRAM
Keyword(4) 3D structure
Keyword(5) Vertical Device
Keyword(6) Stacked Vertical Device
1st Author's Name Tetsuo Endoh
1st Author's Affiliation Center for Interdisciplinary Research, Tohoku University()
Date 2009-06-26
Paper # ED2009-95,SDM2009-90
Volume (vol) vol.109
Number (no) 98
Page pp.pp.-
#Pages 4
Date of Issue