Presentation 2009-06-25
MOS Transistors fabricated on Si(551) surface based on radical reaction processes
A. Teramoto, W. Cheng, C. F. Tye, S. Sugawa, T. Ohmi,
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Abstract(in English) Though the electron mobility in the channel of MOSFET on Si(100) surface which is currently used for LSI devices is largest of all, the hole mobility is smallest. We have reported that the high quality gate insulator films can be formed on any oriented silicon surfaces by using radical oxidation and radical nitridation. Then, We can use Si(551) surface for fabricating the LSI devices. Si(551) is a surface orientation where 8゜ off from the Si(110) in <100> direction and is hard to be roughened by alkali solutions. The hole mobility in Si(551) surface is almost as large as Si(110). We demonstrate the high performance CMOS by fabricating accumulation mode MOSFETs on Si(551) surface.
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Keyword(in English) silicon / surface orientation / MOSFET / mobility / SOI / accumulation mode
Paper # ED2009-84,SDM2009-79
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Committee SDM
Conference Date 2009/6/17(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) MOS Transistors fabricated on Si(551) surface based on radical reaction processes
Sub Title (in English)
Keyword(1) silicon
Keyword(2) surface orientation
Keyword(3) MOSFET
Keyword(4) mobility
Keyword(5) SOI
Keyword(6) accumulation mode
1st Author's Name A. Teramoto
1st Author's Affiliation New Industry Creation Hatchery Center, Tohoku University()
2nd Author's Name W. Cheng
2nd Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
3rd Author's Name C. F. Tye
3rd Author's Affiliation Graduate School of Engineering, Tohoku University
4th Author's Name S. Sugawa
4th Author's Affiliation Graduate School of Engineering, Tohoku University
5th Author's Name T. Ohmi
5th Author's Affiliation New Industry Creation Hatchery Center, Tohoku University:World Premier International Research Center, Tohoku University
Date 2009-06-25
Paper # ED2009-84,SDM2009-79
Volume (vol) vol.109
Number (no) 98
Page pp.pp.-
#Pages 4
Date of Issue