Presentation 2009-06-24
A Study on Lateral Surface Treatment of the CdTe X-ray image-sensor
Jin Kwan Kim, Keedong Yang, Yong Soo Lee, Hee Chul Lee,
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Abstract(in English) A CdTe X-ray sensor for dental X-ray imaging is fabricated and the effect of a lateral surface treatment is investigated. Due to non-uniform edge pixels in the CdTe X-ray sensor, the number of effective pixels that can be used for the final image is reduced, and a line defect is introduced when several sensors are put together for the target resolution. To improve the roughness of the lateral surface, a lateral surface polishing process is introduced. The polishing process reduces dead pixels by 76%, from 304 to 76. By lateral surface polishing, most of the dead pixels near the device edge become normal pixels. The non-uniform edge pixels are improved by the lateral surface treatment without affecting the central pixels of the CdTe X-ray image sensor. The effective resolution is extended to the edges of device; therefore, the entire area of the CdTe X-ray sensor can be used for the final image.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) CdTe / X-ray / Medical imaging sensor / Lateral surface / Surface treatment
Paper # ED2009-69,SDM2009-64
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Conference Information
Committee SDM
Conference Date 2009/6/17(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Lateral Surface Treatment of the CdTe X-ray image-sensor
Sub Title (in English)
Keyword(1) CdTe
Keyword(2) X-ray
Keyword(3) Medical imaging sensor
Keyword(4) Lateral surface
Keyword(5) Surface treatment
1st Author's Name Jin Kwan Kim
1st Author's Affiliation Dept. of EECS, Korea Advanced Institute of Science and Technology()
2nd Author's Name Keedong Yang
2nd Author's Affiliation i3system Company
3rd Author's Name Yong Soo Lee
3rd Author's Affiliation Dept. of EECS, Korea Advanced Institute of Science and Technology
4th Author's Name Hee Chul Lee
4th Author's Affiliation Dept. of EECS, Korea Advanced Institute of Science and Technology:National Nanofab Center
Date 2009-06-24
Paper # ED2009-69,SDM2009-64
Volume (vol) vol.109
Number (no) 98
Page pp.pp.-
#Pages 4
Date of Issue