| Presentation | 2009-08-03 Ising Spin-Glass Error Correction for Unreliable Nanoelectronic Logic Circuits Yasuhiro OKADA, Hisato FUJISAKA, Takeshi KAMIO, Chang-Jun AHN, Kazuhisa HAEIWA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a fault and defect tolerance technique based on Ising spin-glass (ISG) for nanoelectronic logic circuits. An equivalent fault and defect-tolarant circuit of a logic circuit is constructed by cascading an input transformation circuit, a redundant circuit, and an ISG which corrects errors caused in the redundant circuit. We built combinatorial and sequential circuits of this structure and evaluated the error correction performance of their internal ISGs. The ISG exhibits high performance on correcting both permanent defect and transient errors in combinatorial circuits. The ISG has error correction capability also in sequential circuits when the rate of errors in the ISG itself is low. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Ising model / spin-glass / nanoerectronic / error correction / Single electron tunneling / SET |
| Paper # | NLP2009-45 |
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| Conference Information | |
| Committee | NLP |
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| Conference Date | 2009/7/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Nonlinear Problems (NLP) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Ising Spin-Glass Error Correction for Unreliable Nanoelectronic Logic Circuits |
| Sub Title (in English) | |
| Keyword(1) | Ising model |
| Keyword(2) | spin-glass |
| Keyword(3) | nanoerectronic |
| Keyword(4) | error correction |
| Keyword(5) | Single electron tunneling |
| Keyword(6) | SET |
| 1st Author's Name | Yasuhiro OKADA |
| 1st Author's Affiliation | Faculty of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Hisato FUJISAKA |
| 2nd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Takeshi KAMIO |
| 3rd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 4th Author's Name | Chang-Jun AHN |
| 4th Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 5th Author's Name | Kazuhisa HAEIWA |
| 5th Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| Date | 2009-08-03 |
| Paper # | NLP2009-45 |
| Volume (vol) | vol.109 |
| Number (no) | 167 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |