Presentation | 2009-07-21 Evaluation of Defects of HTS Junction on Grain-boundary of Bicrystals Tetsuro MAKI, Xiangyan KONG, Yoshihiro NAKATANI, Tianfang Guan, Hitoshi KUBO, Masayuki ABE, Hideo Itozaki, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Defects of YBCO thin films grown on (100) STO bicrystal grain-boundaries were evaluated. Wedge-shaped defects typically of around submicrometer length were observed at spacing of around 10μm on average along with the grain-boundary by FE-SEM and AFM. In addition to the wedge-shaped defects, meandering-shaped defects were also observed. A YBCO junction array was fabricated on the STO bicrystal to investigate the influence of the defects on the electrical properties of the junctions. R-T curves of the YBCO junctions on the STO bicrystal show different properties with different types of the defects at the grain-boundary. The defects at the grain-boundaries on the STO bicrystal are a possible cause of the YBCO defects at the grain-boundaries and degradation of the boundary quality. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | bicrystal / grain-boundary / defect / high-T_c superconductor / Josephson junction |
Paper # | SCE2009-13 |
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Conference Information | |
Committee | SCE |
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Conference Date | 2009/7/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of Defects of HTS Junction on Grain-boundary of Bicrystals |
Sub Title (in English) | |
Keyword(1) | bicrystal |
Keyword(2) | grain-boundary |
Keyword(3) | defect |
Keyword(4) | high-T_c superconductor |
Keyword(5) | Josephson junction |
1st Author's Name | Tetsuro MAKI |
1st Author's Affiliation | Graduate School of Engineering Science, Osaka University() |
2nd Author's Name | Xiangyan KONG |
2nd Author's Affiliation | Graduate School of Engineering Science, Osaka University |
3rd Author's Name | Yoshihiro NAKATANI |
3rd Author's Affiliation | Graduate School of Engineering Science, Osaka University |
4th Author's Name | Tianfang Guan |
4th Author's Affiliation | Graduate School of Engineering Science, Osaka University |
5th Author's Name | Hitoshi KUBO |
5th Author's Affiliation | Graduate School of Engineering, Osaka University |
6th Author's Name | Masayuki ABE |
6th Author's Affiliation | Graduate School of Engineering, Osaka University |
7th Author's Name | Hideo Itozaki |
7th Author's Affiliation | Graduate School of Engineering Science, Osaka University |
Date | 2009-07-21 |
Paper # | SCE2009-13 |
Volume (vol) | vol.109 |
Number (no) | 141 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |