Presentation 2009-07-21
Evaluation of Defects of HTS Junction on Grain-boundary of Bicrystals
Tetsuro MAKI, Xiangyan KONG, Yoshihiro NAKATANI, Tianfang Guan, Hitoshi KUBO, Masayuki ABE, Hideo Itozaki,
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Abstract(in English) Defects of YBCO thin films grown on (100) STO bicrystal grain-boundaries were evaluated. Wedge-shaped defects typically of around submicrometer length were observed at spacing of around 10μm on average along with the grain-boundary by FE-SEM and AFM. In addition to the wedge-shaped defects, meandering-shaped defects were also observed. A YBCO junction array was fabricated on the STO bicrystal to investigate the influence of the defects on the electrical properties of the junctions. R-T curves of the YBCO junctions on the STO bicrystal show different properties with different types of the defects at the grain-boundary. The defects at the grain-boundaries on the STO bicrystal are a possible cause of the YBCO defects at the grain-boundaries and degradation of the boundary quality.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) bicrystal / grain-boundary / defect / high-T_c superconductor / Josephson junction
Paper # SCE2009-13
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Conference Information
Committee SCE
Conference Date 2009/7/14(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of Defects of HTS Junction on Grain-boundary of Bicrystals
Sub Title (in English)
Keyword(1) bicrystal
Keyword(2) grain-boundary
Keyword(3) defect
Keyword(4) high-T_c superconductor
Keyword(5) Josephson junction
1st Author's Name Tetsuro MAKI
1st Author's Affiliation Graduate School of Engineering Science, Osaka University()
2nd Author's Name Xiangyan KONG
2nd Author's Affiliation Graduate School of Engineering Science, Osaka University
3rd Author's Name Yoshihiro NAKATANI
3rd Author's Affiliation Graduate School of Engineering Science, Osaka University
4th Author's Name Tianfang Guan
4th Author's Affiliation Graduate School of Engineering Science, Osaka University
5th Author's Name Hitoshi KUBO
5th Author's Affiliation Graduate School of Engineering, Osaka University
6th Author's Name Masayuki ABE
6th Author's Affiliation Graduate School of Engineering, Osaka University
7th Author's Name Hideo Itozaki
7th Author's Affiliation Graduate School of Engineering Science, Osaka University
Date 2009-07-21
Paper # SCE2009-13
Volume (vol) vol.109
Number (no) 141
Page pp.pp.-
#Pages 4
Date of Issue