Presentation 2009-07-21
Investigation of characteristics with changing film thickness for Bi-2212/MgO fabricated by the MOD method
Koji Hamanaka, Takashi Tachiki, Takashi Uchida,
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Abstract(in English) We have fabricated a Bi_2Sr_2CaCu_2O_<8+x>(Bi-2212) thin film on a MgO substrate by the metal-organic decomposition (MOD) method to apply the film to high frequency devices such as a terahertz oscillator and detector. However, in order to apply the film to devices flexibly, it is important to evaluate the characteristics of the film with changing the thickness. In this study, we optimized a firing condition for Bi-2212/MgO thin films with the thickness from 40 to 240nm by MOD and investigated the characteristics of the films. As a result, for the film with about 120nm fired at 840℃, a rotation angle η=45deg was dominant. On the other hand, for the film with about 240nm fired at 845℃, η~±12deg. were dominant. When increasing the film thickness, a surface morphology improved, the resistivity at on-set T_c decreased, and the critical current density (J_c) increased. J_c was 4~5×10^5A/cm^2 at 4.2K for the films with 120 and 240nm.
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Keyword(in English) Metal-organic decomposition (MOD) method / film thickness / Bi-2212 thin films / MgO substrate
Paper # SCE2009-9
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Conference Information
Committee SCE
Conference Date 2009/7/14(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Investigation of characteristics with changing film thickness for Bi-2212/MgO fabricated by the MOD method
Sub Title (in English)
Keyword(1) Metal-organic decomposition (MOD) method
Keyword(2) film thickness
Keyword(3) Bi-2212 thin films
Keyword(4) MgO substrate
1st Author's Name Koji Hamanaka
1st Author's Affiliation Department of Electrical and Electronic Engineering, National Defense Academy()
2nd Author's Name Takashi Tachiki
2nd Author's Affiliation Department of Electrical and Electronic Engineering, National Defense Academy
3rd Author's Name Takashi Uchida
3rd Author's Affiliation Department of Electrical and Electronic Engineering, National Defense Academy
Date 2009-07-21
Paper # SCE2009-9
Volume (vol) vol.109
Number (no) 141
Page pp.pp.-
#Pages 6
Date of Issue