Presentation 2009-07-01
A Bound of Errors of a Solution for a Kind of Resistive Circuits Including Active Elements
Tetsuo NISHI, Shin'ichi OISHI, Yusuke NAKAYA,
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Abstract(in English) We show that the validated analysis for some kinds of networks composed of linear passive resistors and some kinds of active elements such as VCVS, CCCS and transistors are possible without any knowledge on the method of constructing a circuit equation, results of LU decomposition, etc. The evaluation of the bound of errors are given in terms of circuit elements and residual currents at each node. The hyperdominancy of the part of linear passive resistor circuit is utilized for the analysis.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) accuracy-guaranteed algorithm / linear passive resistor network / VCVS / CCCS / transistor / hyperdominant matrix
Paper # CAS2009-4,VLD2009-9,SIP2009-21
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Committee SIP
Conference Date 2009/6/24(1days)
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Registration To Signal Processing (SIP)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Bound of Errors of a Solution for a Kind of Resistive Circuits Including Active Elements
Sub Title (in English)
Keyword(1) accuracy-guaranteed algorithm
Keyword(2) linear passive resistor network
Keyword(3) VCVS
Keyword(4) CCCS
Keyword(5) transistor
Keyword(6) hyperdominant matrix
1st Author's Name Tetsuo NISHI
1st Author's Affiliation School of Science and Engineering, Waseda University()
2nd Author's Name Shin'ichi OISHI
2nd Author's Affiliation School of Science and Engineering, Waseda University
3rd Author's Name Yusuke NAKAYA
3rd Author's Affiliation School of Science and Engineering, Waseda University
Date 2009-07-01
Paper # CAS2009-4,VLD2009-9,SIP2009-21
Volume (vol) vol.109
Number (no) 112
Page pp.pp.-
#Pages 6
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