Presentation 2009-06-19
Study of injected carrier energetics in organic-field-effect-transistor by charge modulation spectroscopy
Ryo MIYAZAWA, Dai TAGUCHI, Martin WEIS, Takaaki MANAKA, Mitsumasa IWAMOTO,
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Abstract(in English) We measured CMS spectra and C-V characteristics of P3HT MIS diodes. The CMS spectra and C-V characteristics showed that injected holes from base-Au electrode were accumulated at the semiconductor/insulator interface in P3HT layer. Photo-illumination and d.c biasing caused threshold voltage shift, suggesting the accumulation of excited electrons form P3HT as well as of injected holes form electrodes. Experimental results and analysis show the presence of interfacial states at the P3HT and PI interface as well as polaron states in the P3HT.
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Keyword(in English) CMS / P3HT / Polyimide / Polaron / threshold voltage
Paper # EMD2009-18,CPM2009-30,OME2009-25
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Committee EMD
Conference Date 2009/6/12(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study of injected carrier energetics in organic-field-effect-transistor by charge modulation spectroscopy
Sub Title (in English)
Keyword(1) CMS
Keyword(2) P3HT
Keyword(3) Polyimide
Keyword(4) Polaron
Keyword(5) threshold voltage
1st Author's Name Ryo MIYAZAWA
1st Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology()
2nd Author's Name Dai TAGUCHI
2nd Author's Affiliation /
3rd Author's Name Martin WEIS
3rd Author's Affiliation /
4th Author's Name Takaaki MANAKA
4th Author's Affiliation
5th Author's Name Mitsumasa IWAMOTO
5th Author's Affiliation
Date 2009-06-19
Paper # EMD2009-18,CPM2009-30,OME2009-25
Volume (vol) vol.109
Number (no) 89
Page pp.pp.-
#Pages 4
Date of Issue