| Presentation | 2009-06-05 De-embedding of Board Parasitics with T-parameters for S-parameter Measurements of Integrated Circuits on PCB : Examinations in One-port Measurements Kazuki MAEDA, Kengo IOKIBE, Yoshitaka TOYOTA, Ryuji KOGA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In measuring S-parameters of integrated circuits (ICs) mounted on a printed circuit board, it is necessary to de-embed parasitics on board traces and connectors. The parasitics can be de-embeded by two kinds of methods in the S-parameter measurements: methods that set measurement ports adjacent to ports of IC terminals and methods that extract intrinsic parameters of ICs from measured parameters involving effects of the parasitics. Firstly, we represented several results of the former methods and their possible errors. Secondly, we applied the latter methods to a known RC series circuit as employing T-parameters for the de-embedding of parasitics. The RC series circuit, supposing a typical power-ground impedance of ICs, was extracted successfully up to 2GHz, after T-parameters of board traces had been experimentally obtained. The T-parameters were also obtained through an electromagnetic calculations as refering the structure of the board traces and they produce another set of IC parameters that agreed with the experimental set up to 2GHz. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | T-parameter / de-embedding / IC / EMC model |
| Paper # | EMCJ2009-30 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2009/5/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | De-embedding of Board Parasitics with T-parameters for S-parameter Measurements of Integrated Circuits on PCB : Examinations in One-port Measurements |
| Sub Title (in English) | |
| Keyword(1) | T-parameter |
| Keyword(2) | de-embedding |
| Keyword(3) | IC |
| Keyword(4) | EMC model |
| 1st Author's Name | Kazuki MAEDA |
| 1st Author's Affiliation | Graduate School of Natural Science and Technology, Okayama University() |
| 2nd Author's Name | Kengo IOKIBE |
| 2nd Author's Affiliation | Graduate School of Natural Science and Technology, Okayama University |
| 3rd Author's Name | Yoshitaka TOYOTA |
| 3rd Author's Affiliation | Graduate School of Natural Science and Technology, Okayama University |
| 4th Author's Name | Ryuji KOGA |
| 4th Author's Affiliation | Graduate School of Natural Science and Technology, Okayama University |
| Date | 2009-06-05 |
| Paper # | EMCJ2009-30 |
| Volume (vol) | vol.109 |
| Number (no) | 76 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |