Presentation | 2009-06-19 Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance (VI) Shin-ichi WADA, Taketo SONODA, Keiji KOSHIDA, Mitsuo KIKUCHI, Hiroaki KUBOTA, Koichiro SAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillation mechanism and sliding contact mechanism in the vertical direction. It was set that the oscillating acceleration was 150G or 400G and the sliding force between male pins and female ones was 0.3N or 2.0N. The first measurement was carried out in the condition of 150G and 2.0N with 42 millions' operations and the contact resistance was resulted in about 200Ω. The second one was in the condition of 150G and 0.3N with 44 millions' and it was resulted in about 600-1000Ω. The third one is in the condition of 400G and 2.0N with 22 millions' and it is resulted in about 200Ω. The fourth or the fifth measurement were carried out in the condition of 2.0N or 2.0N with 24 millions' or 26 millions' and they were resulted in about 50-400Ω or 200-600Ω in respectively. It was showed that the starting number of fluctuation of the contact resistance was highest and the distance of the relative sliding was lowest in the case of 150G and 2.0N (measurement 1). It was suggested that the fretting corrosion model or sliding contact one would be applied to the fluctuation of contact resistance. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / sliding contact mechanism / acceleration / contact force / sliding force |
Paper # | EMD2009-19,CPM2009-31,OME2009-26 |
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Conference Information | |
Committee | CPM |
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Conference Date | 2009/6/12(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance (VI) |
Sub Title (in English) | |
Keyword(1) | electrical contact |
Keyword(2) | micro-oscillation |
Keyword(3) | contact resistance |
Keyword(4) | hammering oscillating mechanism |
Keyword(5) | sliding contact mechanism |
Keyword(6) | acceleration |
Keyword(7) | contact force |
Keyword(8) | sliding force |
1st Author's Name | Shin-ichi WADA |
1st Author's Affiliation | TMC System Co., Ltd.() |
2nd Author's Name | Taketo SONODA |
2nd Author's Affiliation | TMC System Co., Ltd. |
3rd Author's Name | Keiji KOSHIDA |
3rd Author's Affiliation | TMC System Co., Ltd. |
4th Author's Name | Mitsuo KIKUCHI |
4th Author's Affiliation | TMC System Co., Ltd. |
5th Author's Name | Hiroaki KUBOTA |
5th Author's Affiliation | TMC System Co., Ltd. |
6th Author's Name | Koichiro SAWA |
6th Author's Affiliation | Keio University K2 Campus |
Date | 2009-06-19 |
Paper # | EMD2009-19,CPM2009-31,OME2009-26 |
Volume (vol) | vol.109 |
Number (no) | 90 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |