Presentation | 2009-03-25 The Experimental Study on Image Feature which estimates Material Thickness Based on Binocular Disparity Yuichi KOBAYASHI, Hisashi OGURO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Recently, lot of technologies have been researched to improve reality of visual media such as still images and motion pictures. We have also studied technology which improves visual quality of images. We have considered that the specification or extraction of visual features is important for this realization. In this report, the frequency analysis method based on binocular disparity is proposed, taking our natural circumstances into account. Here, natural circumstances mean that we observe an object with both eyes. First, the object appearances which correspond to both eyes' images were taken by means of stereo method. Second, space frequencies of those pictures were analyzed with discrete wavelet analysis. Third, stereo matching was achieved with the phase only correlation method and the binocular disparity was calculated. Finally, those binocular disparities were analyzed for variation of frequency and disparity. Our method was applied to some cloth and fur materials. Experimental results show that our method can discriminate the material thickness approximately. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Binocular Disparity / Thickness / Space Frequency Analysis / Wavelet Transform / Phase Only Correlation |
Paper # | MVE2008-111 |
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Conference Information | |
Committee | MVE |
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Conference Date | 2009/3/17(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Media Experience and Virtual Environment (MVE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | The Experimental Study on Image Feature which estimates Material Thickness Based on Binocular Disparity |
Sub Title (in English) | |
Keyword(1) | Binocular Disparity |
Keyword(2) | Thickness |
Keyword(3) | Space Frequency Analysis |
Keyword(4) | Wavelet Transform |
Keyword(5) | Phase Only Correlation |
1st Author's Name | Yuichi KOBAYASHI |
1st Author's Affiliation | Information Technology Laboratory, R & D Division, TOPPAN Printing Co., ltd.() |
2nd Author's Name | Hisashi OGURO |
2nd Author's Affiliation | Information Technology Laboratory, R & D Division, TOPPAN Printing Co., ltd. |
Date | 2009-03-25 |
Paper # | MVE2008-111 |
Volume (vol) | vol.108 |
Number (no) | 490 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |