Presentation 2009-03-10
Minimum span analysis for a combined graph ensemble of low-density parity-check codes
Yujin ISHIKAWA, Yoshiyuki SATO, Gou HOSOYA, Shigeichi HIRASAWA,
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Abstract(in English) The combination of the low-density parity-check (LDPC) code and the belif-propagation (BP) decoding algorithm exhibits a good decoding performance. Now error correction via LDPC code is applied for high speed wireless channel, wired channel and magnetic recording systems. To evaluate the correcting capability for burst erasure, analysis for the LDPC code ensemble has been employed. First, this analytical method evaluates the minimum span of the stopping set, and then, calculate the critical minimum span rate which expresses the rate of the correctable burst erasure for the code length. In this paper, we formulate more accurate critical minimum span rate by using minimum stopping set for the standard Tanner graph ensemble. We then apply it to evaluate the critical minimum span rate for the LR Tanner graph ensemble, which is a combined graph ensemble with a good correcting capability for burst erasure.
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Keyword(in English) low-density parity-check code / stopping set / minimum span / LR Tanner graph ensemble
Paper # IT2008-109,ISEC2008-167,WBS2008-122
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Committee ISEC
Conference Date 2009/3/2(1days)
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Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Minimum span analysis for a combined graph ensemble of low-density parity-check codes
Sub Title (in English)
Keyword(1) low-density parity-check code
Keyword(2) stopping set
Keyword(3) minimum span
Keyword(4) LR Tanner graph ensemble
1st Author's Name Yujin ISHIKAWA
1st Author's Affiliation Department of Industrial and Management Systems Engineering, School of Science and Engineering, Waseda University()
2nd Author's Name Yoshiyuki SATO
2nd Author's Affiliation Major in Industrial and Management Systems Engineering, Graduate School of Creative Science and Engineering, Waseda University
3rd Author's Name Gou HOSOYA
3rd Author's Affiliation Department of Industrial and Management Systems Engineering, School of Creative Science and Engineering, Faculty of Science and Engineering, Waseda University
4th Author's Name Shigeichi HIRASAWA
4th Author's Affiliation Department of Industrial and Management Systems Engineering, School of Creative Science and Engineering, Faculty of Science and Engineering, Waseda University
Date 2009-03-10
Paper # IT2008-109,ISEC2008-167,WBS2008-122
Volume (vol) vol.108
Number (no) 473
Page pp.pp.-
#Pages 6
Date of Issue