Presentation | 2009-03-10 Minimum span analysis for a combined graph ensemble of low-density parity-check codes Yujin ISHIKAWA, Yoshiyuki SATO, Gou HOSOYA, Shigeichi HIRASAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The combination of the low-density parity-check (LDPC) code and the belif-propagation (BP) decoding algorithm exhibits a good decoding performance. Now error correction via LDPC code is applied for high speed wireless channel, wired channel and magnetic recording systems. To evaluate the correcting capability for burst erasure, analysis for the LDPC code ensemble has been employed. First, this analytical method evaluates the minimum span of the stopping set, and then, calculate the critical minimum span rate which expresses the rate of the correctable burst erasure for the code length. In this paper, we formulate more accurate critical minimum span rate by using minimum stopping set for the standard Tanner graph ensemble. We then apply it to evaluate the critical minimum span rate for the LR Tanner graph ensemble, which is a combined graph ensemble with a good correcting capability for burst erasure. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | low-density parity-check code / stopping set / minimum span / LR Tanner graph ensemble |
Paper # | IT2008-109,ISEC2008-167,WBS2008-122 |
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Conference Information | |
Committee | ISEC |
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Conference Date | 2009/3/2(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Information Security (ISEC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Minimum span analysis for a combined graph ensemble of low-density parity-check codes |
Sub Title (in English) | |
Keyword(1) | low-density parity-check code |
Keyword(2) | stopping set |
Keyword(3) | minimum span |
Keyword(4) | LR Tanner graph ensemble |
1st Author's Name | Yujin ISHIKAWA |
1st Author's Affiliation | Department of Industrial and Management Systems Engineering, School of Science and Engineering, Waseda University() |
2nd Author's Name | Yoshiyuki SATO |
2nd Author's Affiliation | Major in Industrial and Management Systems Engineering, Graduate School of Creative Science and Engineering, Waseda University |
3rd Author's Name | Gou HOSOYA |
3rd Author's Affiliation | Department of Industrial and Management Systems Engineering, School of Creative Science and Engineering, Faculty of Science and Engineering, Waseda University |
4th Author's Name | Shigeichi HIRASAWA |
4th Author's Affiliation | Department of Industrial and Management Systems Engineering, School of Creative Science and Engineering, Faculty of Science and Engineering, Waseda University |
Date | 2009-03-10 |
Paper # | IT2008-109,ISEC2008-167,WBS2008-122 |
Volume (vol) | vol.108 |
Number (no) | 473 |
Page | pp.pp.- |
#Pages | 6 |
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