| Presentation | 2009-03-06 Highly accurate measurement of the InAlAs-APD excess noise Jun Ishihara, Takeshi Nakata, Kenichi Kasahara, Kikuo Makita, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The excess noise and ionization coefficient ratio of InAlAs avalanche photodiodes (APDs) for Gbps optical fiber communication have been measured. To obtain these values accurately, we used a differential amplifier, and determined the optical current at which the avalanche multiplication = 1. These made possible the excess noise measurement including the low multiplication region. Excess noise was slightly dependent on the optical input intensity, decreasing at high incident optical intensities. Measured ionization coefficient ratio at M=10 was 0.18 and 0.17 with multiplication layer width 0.2 and 0.7μm respectively. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Avalanche Photodiode / Excess noise / Ionization coefficient ratio / Incident light power dependence / Multiplication layer width dependence |
| Paper # | OFT2008-95,OPE2008-195 |
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| Conference Information | |
| Committee | OFT |
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| Conference Date | 2009/2/27(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Optical Fiber Technology (OFT) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Highly accurate measurement of the InAlAs-APD excess noise |
| Sub Title (in English) | |
| Keyword(1) | Avalanche Photodiode |
| Keyword(2) | Excess noise |
| Keyword(3) | Ionization coefficient ratio |
| Keyword(4) | Incident light power dependence |
| Keyword(5) | Multiplication layer width dependence |
| 1st Author's Name | Jun Ishihara |
| 1st Author's Affiliation | Faculty of Science and Engineering, Ritsumeikan University() |
| 2nd Author's Name | Takeshi Nakata |
| 2nd Author's Affiliation | Nano Electronics Lab., NEC |
| 3rd Author's Name | Kenichi Kasahara |
| 3rd Author's Affiliation | Faculty of Science and Engineering, Ritsumeikan University |
| 4th Author's Name | Kikuo Makita |
| 4th Author's Affiliation | Nano Electronics Lab., NEC |
| Date | 2009-03-06 |
| Paper # | OFT2008-95,OPE2008-195 |
| Volume (vol) | vol.108 |
| Number (no) | 450 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |