Presentation 2009-04-21
A design of testable response analyzers in built-in self-test
Yuki FUKAZAWA, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) In the BIST (Built-in self-test) scheme, the occurrence of faults in BIST circuits, e.g., test generators and response compactors, causes unreliable testing of chips, so that it results in filed defects of the chips and yield loss. In this study, we focus on a concurrent testability of BIST circuits. Testing a circuit-under-test (CUT), a concurrently testable BIST circuit can test itself, and distinguish the faults in the BIST circuits from those in the CUT based on an obtained signature. We propose a concurrently testable response compactor, called a coding response compactor, and present two instances of coding response compactors, which are based on repetition codes and cyclic codes. Experimental results show the relationship between the concurrently testability and area overhead for the proposed coding response compactors.
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Keyword(in English) Built-in self-test / MISR compactor / coding / concurrent test
Paper # CPSY2009-7,DC2009-7
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Committee DC
Conference Date 2009/4/14(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A design of testable response analyzers in built-in self-test
Sub Title (in English)
Keyword(1) Built-in self-test
Keyword(2) MISR compactor
Keyword(3) coding
Keyword(4) concurrent test
1st Author's Name Yuki FUKAZAWA
1st Author's Affiliation Graduate School of Information Sciences, Hiroshima City University()
2nd Author's Name Yuki YOSHIKAWA
2nd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
Date 2009-04-21
Paper # CPSY2009-7,DC2009-7
Volume (vol) vol.109
Number (no) 12
Page pp.pp.-
#Pages 6
Date of Issue