Presentation | 2009-04-21 A design of testable response analyzers in built-in self-test Yuki FUKAZAWA, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In the BIST (Built-in self-test) scheme, the occurrence of faults in BIST circuits, e.g., test generators and response compactors, causes unreliable testing of chips, so that it results in filed defects of the chips and yield loss. In this study, we focus on a concurrent testability of BIST circuits. Testing a circuit-under-test (CUT), a concurrently testable BIST circuit can test itself, and distinguish the faults in the BIST circuits from those in the CUT based on an obtained signature. We propose a concurrently testable response compactor, called a coding response compactor, and present two instances of coding response compactors, which are based on repetition codes and cyclic codes. Experimental results show the relationship between the concurrently testability and area overhead for the proposed coding response compactors. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Built-in self-test / MISR compactor / coding / concurrent test |
Paper # | CPSY2009-7,DC2009-7 |
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Conference Information | |
Committee | DC |
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Conference Date | 2009/4/14(1days) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A design of testable response analyzers in built-in self-test |
Sub Title (in English) | |
Keyword(1) | Built-in self-test |
Keyword(2) | MISR compactor |
Keyword(3) | coding |
Keyword(4) | concurrent test |
1st Author's Name | Yuki FUKAZAWA |
1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
2nd Author's Name | Yuki YOSHIKAWA |
2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
3rd Author's Name | Hideyuki ICHIHARA |
3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
4th Author's Name | Tomoo INOUE |
4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
Date | 2009-04-21 |
Paper # | CPSY2009-7,DC2009-7 |
Volume (vol) | vol.109 |
Number (no) | 12 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |