| Presentation | 2009-02-27 Thermoelectric characteristics of Si nanostructures for a high-efficiency thermoelectric device Hiroya IKEDA, Faiz SALLEH, Kiyosumi ASAI, Akihiro ISHIDA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to develop a high-efficiency thermoelectric device, we have investigated the thermoelectric characteristics of Si nanostructures. We have measured the Seebeck coefficient for ultrathin SOI (silicon on insulator) layers with various thickness and carrier concentration to clarify the electron confinement effect in the thermoelectric characteristics. In the present paper, we show the theoretically-evaluated Seebeck coefficient for Si, based on the Boltzmann transport equation, and demonstrate a new method for the Seebeck-coefficient measurement using a KFM (Kelvin-probe force microscopy) technique. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | thermoelectricity / nanostructure / SOI wafer / Seebeck coefficient / Kelvin-probe force microscope |
| Paper # | ED2008-238,SDM2008-230 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 2009/2/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Thermoelectric characteristics of Si nanostructures for a high-efficiency thermoelectric device |
| Sub Title (in English) | |
| Keyword(1) | thermoelectricity |
| Keyword(2) | nanostructure |
| Keyword(3) | SOI wafer |
| Keyword(4) | Seebeck coefficient |
| Keyword(5) | Kelvin-probe force microscope |
| 1st Author's Name | Hiroya IKEDA |
| 1st Author's Affiliation | Research Institute of Electronics, Shizuoka University() |
| 2nd Author's Name | Faiz SALLEH |
| 2nd Author's Affiliation | Research Institute of Electronics, Shizuoka University |
| 3rd Author's Name | Kiyosumi ASAI |
| 3rd Author's Affiliation | Research Institute of Electronics, Shizuoka University |
| 4th Author's Name | Akihiro ISHIDA |
| 4th Author's Affiliation | Faculty of Engineering, Shizuoka University |
| Date | 2009-02-27 |
| Paper # | ED2008-238,SDM2008-230 |
| Volume (vol) | vol.108 |
| Number (no) | 437 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |