Presentation 2009-02-27
Silicon Nanowire pMOSFETs and Single-Hole Transistors at Room Temperature under Uniaxial Strain
YeonJoo JEONG, Jiezhi CHEN, Takuya SARAYA, Toshiro HIRAMOTO,
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Abstract(in English) Uniaxial strain effects on NW pFET and SHT are investigated. In the NW pFET, considerably larger current modulation than NW nFET is observed. To enhance the MOSFET mobility, tensile and compressive direction is beneficial to transverse and longitudinal strain, respectively. The strain effect is decreased as NW width becomes narrower due to small effective mass modulation at narrow NW pFET. In the SHT, Coulomb oscillation characteristics are modulated by the strain and after oscillation vanishes current modulation converges to constant value due to drift current in SHT.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Nanowire MOSFET / Single-hole transistor / Uniaxial strain / Mobility enhancement / Effective mass / Tunneling probability / Quantum energy level
Paper # ED2008-234,SDM2008-226
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Committee ED
Conference Date 2009/2/19(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Silicon Nanowire pMOSFETs and Single-Hole Transistors at Room Temperature under Uniaxial Strain
Sub Title (in English)
Keyword(1) Nanowire MOSFET
Keyword(2) Single-hole transistor
Keyword(3) Uniaxial strain
Keyword(4) Mobility enhancement
Keyword(5) Effective mass
Keyword(6) Tunneling probability
Keyword(7) Quantum energy level
1st Author's Name YeonJoo JEONG
1st Author's Affiliation Institute of Industrial Science, University of Tokyo()
2nd Author's Name Jiezhi CHEN
2nd Author's Affiliation Institute of Industrial Science, University of Tokyo
3rd Author's Name Takuya SARAYA
3rd Author's Affiliation Institute of Industrial Science, University of Tokyo
4th Author's Name Toshiro HIRAMOTO
4th Author's Affiliation Institute of Industrial Science, University of Tokyo
Date 2009-02-27
Paper # ED2008-234,SDM2008-226
Volume (vol) vol.108
Number (no) 437
Page pp.pp.-
#Pages 4
Date of Issue