Presentation 2009-02-26
Characteristics of Single Electron Transistor and Turnstile With Input Discretizer
Masashi TAKIGUCHI, Shota HAYAMI, Masaki OTSUKA, Akio KAWAI, Masataka MORIYA, Tadayuki KOBAYASHI, Hiroshi SHIMADA, Yoshinao MIZUGAKI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In this report, we propose an input discretizer for single-electron devices. The input discretizer comprises one small tunnel junction and two capacitors. When the two capacitors have the identical capacitance, the input discretizer discretizes the gate charge with interval of a half of the elementary charge e, which enhances the performance of single-electron devices. A single-electron transistor with the input discretizer has abrupt switchings of the Coulomb blockade thresholds, resulting in steep responses to the input signal. A single-electron turnstile with the input discretizer enhances its operation margins for generating current plateaus. Both analytical and numerical results are demonstrated.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Coulomb blockade / single-electron box / single-electron transistor / single-electron turnstile
Paper # ED2008-229,SDM2008-221
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Committee ED
Conference Date 2009/2/19(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Characteristics of Single Electron Transistor and Turnstile With Input Discretizer
Sub Title (in English)
Keyword(1) Coulomb blockade
Keyword(2) single-electron box
Keyword(3) single-electron transistor
Keyword(4) single-electron turnstile
1st Author's Name Masashi TAKIGUCHI
1st Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications()
2nd Author's Name Shota HAYAMI
2nd Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
3rd Author's Name Masaki OTSUKA
3rd Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
4th Author's Name Akio KAWAI
4th Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
5th Author's Name Masataka MORIYA
5th Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
6th Author's Name Tadayuki KOBAYASHI
6th Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
7th Author's Name Hiroshi SHIMADA
7th Author's Affiliation Department of Applied Physics and Chemistry, The University of Electro-Communications
8th Author's Name Yoshinao MIZUGAKI
8th Author's Affiliation Department of Electronic Engineering, The University of Electro-Communications
Date 2009-02-26
Paper # ED2008-229,SDM2008-221
Volume (vol) vol.108
Number (no) 437
Page pp.pp.-
#Pages 6
Date of Issue