| Presentation | 2009-02-16 A Secure Scan Design Approach Using Extended de Bruijn Graph Hideo FUJIWARA, Marie Engelene J. OBIEN, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Scan design makes digital circuits easily testable, however, it can also be exploited to be used for hacking the chip. This paper introduces a new secure scan design approach using extended de Bruijn graph, which aims to satisfy both testability and security of digital circuits. The approach is only to replace the original scan chains to modified scan registers called extended scan registers. This method requires very little area overhead and no performance overhead. Moreover, no additional keys and controller circuits outside of the scan chain are needed, thus making the scheme low-cost and efficient. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Secure scan design / Security / Testability / Design-for-test / Extended de Bruijn graph |
| Paper # | DC2008-78 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/2/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Secure Scan Design Approach Using Extended de Bruijn Graph |
| Sub Title (in English) | |
| Keyword(1) | Secure scan design |
| Keyword(2) | Security |
| Keyword(3) | Testability |
| Keyword(4) | Design-for-test |
| Keyword(5) | Extended de Bruijn graph |
| 1st Author's Name | Hideo FUJIWARA |
| 1st Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology() |
| 2nd Author's Name | Marie Engelene J. OBIEN |
| 2nd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology |
| Date | 2009-02-16 |
| Paper # | DC2008-78 |
| Volume (vol) | vol.108 |
| Number (no) | 431 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |