| Presentation | 2009-02-16 On Tests to Detect Open faults with Considering Adjacent Lines Tetsuya WATANABE, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Toshiyuki TSUTUSMI, Kouji YAMAZAKI, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Yuzo TAKAMATSU, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconnect layers and the long copper interconnect wires. Under the modern manufacturing technologies, the open defect is the one of the significant issues. Under the open fault model with considering the affects of adjacent lines, excitation of the open fault is depended on the test patterns. Therefore, the layout information is needed to generate a test pattern for an open fault. However, it is not easy to extract accurate circuit parameters of a deep sub-micron LSI. We have already proposed an open fault model without using the accurate circuit parameters. In this paper, we propose a method for generating test patterns using only information about adjacent lines of the target open fault. Experimental results show that the proposed method is able to generate the test patterns for the open faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | open faults / test generation / adjacent lines |
| Paper # | DC2008-74 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/2/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Tests to Detect Open faults with Considering Adjacent Lines |
| Sub Title (in English) | |
| Keyword(1) | open faults |
| Keyword(2) | test generation |
| Keyword(3) | adjacent lines |
| 1st Author's Name | Tetsuya WATANABE |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Hiroshi TAKAHASHI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Yoshinobu HIGAMI |
| 3rd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 4th Author's Name | Toshiyuki TSUTUSMI |
| 4th Author's Affiliation | Meiji University |
| 5th Author's Name | Kouji YAMAZAKI |
| 5th Author's Affiliation | Meiji University |
| 6th Author's Name | Hiroyuki YOTSUYANAGI |
| 6th Author's Affiliation | Graduate School of Advanced Technology and Science, the Univeresity of Tokushima |
| 7th Author's Name | Masaki HASHIZUME |
| 7th Author's Affiliation | Graduate School of Advanced Technology and Science, the Univeresity of Tokushima |
| 8th Author's Name | Yuzo TAKAMATSU |
| 8th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| Date | 2009-02-16 |
| Paper # | DC2008-74 |
| Volume (vol) | vol.108 |
| Number (no) | 431 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |