| Presentation | 2009-02-16 A method for generating defect oriented test patterns for combinatorial circuit Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Taisuke IZUMI, Takashi AIKYO, Yuzo TAKAMATSU, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With shrinking of LSIs, the diversification of defective mode due to defects becomes a critical issue. Therefore, the test patterns that can detect bridging faults and open faults are needed to maintain the reliability of LSIs. In this paper, we propose a method for generating the defect diagnostic test patterns by considering fault excitation conditions for various fault models. The proposed method uses the defect detection probability derived from the fault excitation functions to select the defect diagnostic test patterns form a given test pattern set. From the experimental results, we show that the set of defect diagnostic test patterns can detect more fault models under the less number of test patterns. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | defect / defect oriented test pattern / fault excitation function / method for selecting test patterns |
| Paper # | DC2008-73 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/2/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A method for generating defect oriented test patterns for combinatorial circuit |
| Sub Title (in English) | |
| Keyword(1) | defect |
| Keyword(2) | defect oriented test pattern |
| Keyword(3) | fault excitation function |
| Keyword(4) | method for selecting test patterns |
| 1st Author's Name | Hiroshi TAKAHASHI |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Yoshinobu HIGAMI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Taisuke IZUMI |
| 3rd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 4th Author's Name | Takashi AIKYO |
| 4th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 5th Author's Name | Yuzo TAKAMATSU |
| 5th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| Date | 2009-02-16 |
| Paper # | DC2008-73 |
| Volume (vol) | vol.108 |
| Number (no) | 431 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |