Presentation 2009-02-16
On the Acceleration of Redundancy Identification for Hard-to-ATPG faults Using SAT
Yusuke AKIYAMA, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, Kouji YAMAZAKI,
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Abstract(in English) Recently, 100% Fault coverage required in VLSI testing. However, ATPG algorithms can not classify all hard-to-test faults in reasonable time. The number of unclassified faults increase with high complexity and density of VLSIs. It is hard to generate a test pattern set with 100% fault efficiency because aborted faults are recognized as undetected faults. It is reported that many of undetected faults are redundant faults. Therefore, it is very important to identify redundant faults efficiently. On this paper, we propose a redundant fault identification method using SAT for justification processing Experimental results show that own method in effective for ITC'99 benchmark circuits.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SAT / Hard-to-ATPG faults / Redundancy identification / Reconvergence / Justification
Paper # DC2008-70
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Committee DC
Conference Date 2009/2/9(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On the Acceleration of Redundancy Identification for Hard-to-ATPG faults Using SAT
Sub Title (in English)
Keyword(1) SAT
Keyword(2) Hard-to-ATPG faults
Keyword(3) Redundancy identification
Keyword(4) Reconvergence
Keyword(5) Justification
1st Author's Name Yusuke AKIYAMA
1st Author's Affiliation Graduate School of Industrial Technology, Nihon University()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation College of Industrial Technology, Nihon University
3rd Author's Name Masayoshi YOSHIMURA
3rd Author's Affiliation Graduate School of Infomation Science and Electrical Engineering, Kyushu University
4th Author's Name Kouji YAMAZAKI
4th Author's Affiliation School of Information and Communication, Meiji University
Date 2009-02-16
Paper # DC2008-70
Volume (vol) vol.108
Number (no) 431
Page pp.pp.-
#Pages 6
Date of Issue