| Presentation | 2009-02-16 On the Acceleration of Threshold Test Generation Based on Fault Acceptability Yusuke NAKASHIMA, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | If the existence of a fault in a circuit only causes negligible effect on its application, the fault is said to be acceptable. The literature[2] considered a fault that causes an error exceeding a given threshold as an unacceptable fault, and proposed an algorithm for generating test-patterns that detect only unacceptable faults. Unlike general test generation algorithms, this algorithm uses 16-valued logic to calculate possible errors at the primary outputs precisely, and therefore some circuits require large computational time with high fault efficiency for the algorithm. This paper discusses the acceleration of the threshold test generation algorithm. Focusing on a property of the PODEM algorithm for fault effect propagation and a sufficient condition on the detection of unacceptable faults, the paper proposes three heuristics for fault effect propagation. Experimental results show that the proposed heuristics work effectively for generating test-patterns of unacceptable faults with small computational time. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | acceptable faults / error significance / threshold test generation / PODEM |
| Paper # | DC2008-68 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/2/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On the Acceleration of Threshold Test Generation Based on Fault Acceptability |
| Sub Title (in English) | |
| Keyword(1) | acceptable faults |
| Keyword(2) | error significance |
| Keyword(3) | threshold test generation |
| Keyword(4) | PODEM |
| 1st Author's Name | Yusuke NAKASHIMA |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Yuki YOSHIKAWA |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2009-02-16 |
| Paper # | DC2008-68 |
| Volume (vol) | vol.108 |
| Number (no) | 431 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |