Presentation 2009-02-16
On the Acceleration of Threshold Test Generation Based on Fault Acceptability
Yusuke NAKASHIMA, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) If the existence of a fault in a circuit only causes negligible effect on its application, the fault is said to be acceptable. The literature[2] considered a fault that causes an error exceeding a given threshold as an unacceptable fault, and proposed an algorithm for generating test-patterns that detect only unacceptable faults. Unlike general test generation algorithms, this algorithm uses 16-valued logic to calculate possible errors at the primary outputs precisely, and therefore some circuits require large computational time with high fault efficiency for the algorithm. This paper discusses the acceleration of the threshold test generation algorithm. Focusing on a property of the PODEM algorithm for fault effect propagation and a sufficient condition on the detection of unacceptable faults, the paper proposes three heuristics for fault effect propagation. Experimental results show that the proposed heuristics work effectively for generating test-patterns of unacceptable faults with small computational time.
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Keyword(in English) acceptable faults / error significance / threshold test generation / PODEM
Paper # DC2008-68
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Committee DC
Conference Date 2009/2/9(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On the Acceleration of Threshold Test Generation Based on Fault Acceptability
Sub Title (in English)
Keyword(1) acceptable faults
Keyword(2) error significance
Keyword(3) threshold test generation
Keyword(4) PODEM
1st Author's Name Yusuke NAKASHIMA
1st Author's Affiliation Graduate School of Information Sciences, Hiroshima City University()
2nd Author's Name Yuki YOSHIKAWA
2nd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
Date 2009-02-16
Paper # DC2008-68
Volume (vol) vol.108
Number (no) 431
Page pp.pp.-
#Pages 6
Date of Issue