Presentation | 2009-01-29 Time-Frequency distribution profiling for response characteristics test of ultra-fast optical devices with optical spectrogram scope (OSS)" Tsuyoshi KONISHI, Hiroomi GOTO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, we review and report the optical spectrogram scope (OSS) as a powerful measurement instrument for response characteristic test of ultra-fast all-optical devices and sub-systems in photonic networks. We apply OSS to optical signals passing through some optical devices and visualize its time-frequency status in a birdpsilas-eye view to demonstrate its usefulness for response characteristics test of ultra-fast optical devices including passive devices. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Optical devices / Time-Frequency analysis / Time-resolved spectroscopy / Dispersion |
Paper # | PN2008-52,OPE2008-155,LQE2008-152 |
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Committee | LQE |
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Conference Date | 2009/1/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Lasers and Quantum Electronics (LQE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Time-Frequency distribution profiling for response characteristics test of ultra-fast optical devices with optical spectrogram scope (OSS)" |
Sub Title (in English) | |
Keyword(1) | Optical devices |
Keyword(2) | Time-Frequency analysis |
Keyword(3) | Time-resolved spectroscopy |
Keyword(4) | Dispersion |
1st Author's Name | Tsuyoshi KONISHI |
1st Author's Affiliation | Graduate School of Engineering, Osaka University() |
2nd Author's Name | Hiroomi GOTO |
2nd Author's Affiliation | Graduate School of Engineering, Osaka University |
Date | 2009-01-29 |
Paper # | PN2008-52,OPE2008-155,LQE2008-152 |
Volume (vol) | vol.108 |
Number (no) | 419 |
Page | pp.pp.- |
#Pages | 4 |
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