Presentation 2009-01-29
Time-Frequency distribution profiling for response characteristics test of ultra-fast optical devices with optical spectrogram scope (OSS)"
Tsuyoshi KONISHI, Hiroomi GOTO,
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Abstract(in English) In this paper, we review and report the optical spectrogram scope(OSS) as a powerful measurement instrument for response characteristic test of ultra-fast all-optical devices and sub-systems in photonic networks. We apply OSS to optical signals passing through some optical devices and visualize its time-frequency status in a birdpsilas-eye view to demonstrate its usefulness for response characteristics test of ultra-fast optical devices including passive devices.
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Keyword(in English) Optical devices / Time-Frequency analysis / Time-resolved spectroscopy / Dispersion
Paper # PN2008-52,OPE2008-155,LQE2008-152
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Committee OPE
Conference Date 2009/1/22(1days)
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Registration To Optoelectronics (OPE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Time-Frequency distribution profiling for response characteristics test of ultra-fast optical devices with optical spectrogram scope (OSS)"
Sub Title (in English)
Keyword(1) Optical devices
Keyword(2) Time-Frequency analysis
Keyword(3) Time-resolved spectroscopy
Keyword(4) Dispersion
1st Author's Name Tsuyoshi KONISHI
1st Author's Affiliation Graduate School of Engineering, Osaka University()
2nd Author's Name Hiroomi GOTO
2nd Author's Affiliation Graduate School of Engineering, Osaka University
Date 2009-01-29
Paper # PN2008-52,OPE2008-155,LQE2008-152
Volume (vol) vol.108
Number (no) 418
Page pp.pp.-
#Pages 4
Date of Issue