| Presentation | 2009/1/22 Subjective Assesment of Image Quality in Simultaneous Scanning of Multiple line on PDP Takenobu USUI, Keiji ISHII, Yoshikuni HIRANO, Yoshimichi TAKANO, Yukio MURAKAMI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We are currently in the process of developing Super-Hi-Vision (SHV) system with 4320 scanning lines. In order to reproduce the image obtained on SHV on plasma display panel (PDP), the frequency of address drive circuit must be increased. This is because the address discharge period for 4320 scanning lines is so long that the desired frame rate and brightness cannot be secured for PDP. However, an increase in the frequency of the address drive circuit can result in unstable discharge and image degradation. Hence, we propose a method for simultaneous scanning of multiple lines to shorten the address discharge period and also perform a subjective assessment test to evaluate the quality of the image obtained with this method. The test results reveal a significant degradation in image quality when this method is applied to subfields with a large luminescence weight. We also confirm that it is advantageous to use the minimum error method to choose the display data. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | PDP / driving circuit / SHV |
| Paper # | EID2008-63 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 2009/1/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Assistant | |
| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Subjective Assesment of Image Quality in Simultaneous Scanning of Multiple line on PDP |
| Sub Title (in English) | |
| Keyword(1) | PDP |
| Keyword(2) | driving circuit |
| Keyword(3) | SHV |
| 1st Author's Name | Takenobu USUI |
| 1st Author's Affiliation | NHK Science & Technical Research Laboratories() |
| 2nd Author's Name | Keiji ISHII |
| 2nd Author's Affiliation | NHK Science & Technical Research Laboratories |
| 3rd Author's Name | Yoshikuni HIRANO |
| 3rd Author's Affiliation | NHK Science & Technical Research Laboratories |
| 4th Author's Name | Yoshimichi TAKANO |
| 4th Author's Affiliation | NHK Science & Technical Research Laboratories |
| 5th Author's Name | Yukio MURAKAMI |
| 5th Author's Affiliation | NHK Science & Technical Research Laboratories |
| Date | 2009/1/22 |
| Paper # | EID2008-63 |
| Volume (vol) | vol.108 |
| Number (no) | 421 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |