| Presentation | 2009/1/9 (1) IMID 2008 : TFT Technologies Kenichi TAKATORI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This article reports on the TFT technologies, excluding the TFTs on flexible substrate and organic TFTs, presented in IMID 2008. Reliability is the keyword for this year's TFT technologies in IMID. In polycrystalline TFT, the reliability related to short-channel TFTs and circuit integrations is reported. In the AM-OLED, the reliability of OLED material itself and the reliability of the driving TFTs, such as amorphous silicon TFTs or oxide TFTs, are equally reported. It's particularly worth noting that the reliability of the oxide TFTs is widely reported in this year's IMID. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | IMID / TFT / Thin Film Transistor / Reliability |
| Paper # | EID2008-44 |
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| Conference Information | |
| Committee | EID |
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| Conference Date | 2009/1/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Electronic Information Displays (EID) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | (1) IMID 2008 : TFT Technologies |
| Sub Title (in English) | |
| Keyword(1) | IMID |
| Keyword(2) | TFT |
| Keyword(3) | Thin Film Transistor |
| Keyword(4) | Reliability |
| 1st Author's Name | Kenichi TAKATORI |
| 1st Author's Affiliation | Research Division, NEC LCD Technologies, Inc.() |
| Date | 2009/1/9 |
| Paper # | EID2008-44 |
| Volume (vol) | vol.108 |
| Number (no) | 381 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |