Presentation 2009-01-15
High-frequency and low-noise performances of InP-based HEMTs for millimeter-wave monolithic integrated circuits
Issei WATANABE, Akira ENDOH, Takashi MIMURA, Toshiaki MATSUI,
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Abstract(in English) InP-based high electron mobility transistors (HEMTs) are the most promising devices not only for future high-speed and high-frequency wireless communications but also expansion of radio spectrum resources in millimeter-(30-300GHz) and sub-millimeter-wave (300 GHz-3 THz) frequency bands. In this contribution, we measured noise characteristics of 35-nm-gate In_<0.7>Ga_<0.3>As/In_<0.52>Al_<0.48>As HEMTs at a frequency of 90GHz, and achieved a minimum noise figure (NF_) of 0.8dB and an associated gain (G_a) of 5.7dB when biased at a drain-source voltage (V_) of 0.8V and a gate-source voltage (V_) of -0.1V. Furthermore, we also obtained an NF_ of 1.0dB, a cutoff frequency (f_T) of 520GHz and a maximum oscillation frequency (f_) of 425GHz when biased at V_=0.8V and V_=0.0V. The simultaneous achievement of high f_T, high f_, and low NF_ is the first demonstration for InP-based HEMTs with over 500-GHz-f_T.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InP-based HEMT / InGaAs / InAlAs / minimum noise figure (NF_) / cutoff frequency (f_T) / maximum oscillation frequency (f_)
Paper # ED2008-214,MW2008-179
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Committee MW
Conference Date 2009/1/7(1days)
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Registration To Microwaves (MW)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High-frequency and low-noise performances of InP-based HEMTs for millimeter-wave monolithic integrated circuits
Sub Title (in English)
Keyword(1) InP-based HEMT
Keyword(2) InGaAs
Keyword(3) InAlAs
Keyword(4) minimum noise figure (NF_)
Keyword(5) cutoff frequency (f_T)
Keyword(6) maximum oscillation frequency (f_)
1st Author's Name Issei WATANABE
1st Author's Affiliation National Institute of Info. & Com. Tech.()
2nd Author's Name Akira ENDOH
2nd Author's Affiliation National Institute of Info. & Com. Tech.
3rd Author's Name Takashi MIMURA
3rd Author's Affiliation National Institute of Info. & Com. Tech.:Fujitsu Laboratories Limited
4th Author's Name Toshiaki MATSUI
4th Author's Affiliation National Institute of Info. & Com. Tech.
Date 2009-01-15
Paper # ED2008-214,MW2008-179
Volume (vol) vol.108
Number (no) 377
Page pp.pp.-
#Pages 5
Date of Issue