Presentation | 2009/1/5 AUTOMATIC SCALE DETECTION BASED ON DIFFERENCE OF CURVATURE(International Workshop on Advanced Image Technology 2009) Kei Kawamura, Daisuke Ishii, Hiroshi Watanabe, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Scale-invariant feature is an effective method for retrieving and classifying images. In this study, we analyze a scaleinvariant planar curve features for developing 2D shapes. Scale-space filtering is used to determine contour structures on different scales. However, it is difficult to track significant points on different scales. In mathematics, curvature is considered to be fundamental feature of a planar curve. However, the curvature of a digitized planar curve depends on a scale. Therefore, automatic scale detection for curvature analysis is required for practical use. We propose a technique for achieving automatic scale detection based on difference of curvature. Once the curvature values are normalized with regard to the scale, we can calculate difference in the curvature values for different scales. Further, an appropriate scale and its position are detected simultaneously, thereby avoiding tracking problem. Appropriate scales and their positions can be detected with high accuracy. An advantage of the proposed method is that the detected significant points do not need to be located in the same contour. The validity of the proposed method is confirmed by experimental results. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | scale detection / curvature / planar curve / pattern recognition |
Paper # | IE2008-168 |
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Committee | IE |
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Conference Date | 2009/1/5(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Image Engineering (IE) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | AUTOMATIC SCALE DETECTION BASED ON DIFFERENCE OF CURVATURE(International Workshop on Advanced Image Technology 2009) |
Sub Title (in English) | |
Keyword(1) | scale detection |
Keyword(2) | curvature |
Keyword(3) | planar curve |
Keyword(4) | pattern recognition |
1st Author's Name | Kei Kawamura |
1st Author's Affiliation | Graduate School of Global Information and Telecommunication Studies Waseda University() |
2nd Author's Name | Daisuke Ishii |
2nd Author's Affiliation | Graduate School of Global Information and Telecommunication Studies Waseda University |
3rd Author's Name | Hiroshi Watanabe |
3rd Author's Affiliation | Graduate School of Global Information and Telecommunication Studies Waseda University |
Date | 2009/1/5 |
Paper # | IE2008-168 |
Volume (vol) | vol.108 |
Number (no) | 373 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |