| Presentation | 2009-01-29 Evaluation of Defects at Grain-boundaries on YBCO/STO Bicrystals Tetsuro MAKI, Xiangyan KONG, Yoshihiro NAKATANI, Hitoshi KUBO, Masayuki ABE, Hideo ITOZAKI, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | There is a possibility that surface defects at grain boundary of bicrystal substrates influenced to make defects of YBCO thin films grown on the bicrystal substrates. The defects at grain boundary of STO bicrystal substrates and YBCO thin films grown on the substrates were evaluated by FE-SEM and AFM observation. The defects with the shape reflected by misorientaion angles of the substrates were observed at the STO bicrystal substrates. After film deposition of YBCO, some of the defects of the substrates were flattened, but some made defects of the YBCO thin films grown on them. The observation difference between FE-SEM and AFM was also discussed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | bicrystal / grain-boundary / defect / high-T_C superconductor / Josephson junction |
| Paper # | SCE2008-33 |
| Date of Issue |
| Conference Information | |
| Committee | SCE |
|---|---|
| Conference Date | 2009/1/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Defects at Grain-boundaries on YBCO/STO Bicrystals |
| Sub Title (in English) | |
| Keyword(1) | bicrystal |
| Keyword(2) | grain-boundary |
| Keyword(3) | defect |
| Keyword(4) | high-T_C superconductor |
| Keyword(5) | Josephson junction |
| 1st Author's Name | Tetsuro MAKI |
| 1st Author's Affiliation | Graduate School of Engineering Science, Osaka University() |
| 2nd Author's Name | Xiangyan KONG |
| 2nd Author's Affiliation | Graduate School of Engineering Science, Osaka University |
| 3rd Author's Name | Yoshihiro NAKATANI |
| 3rd Author's Affiliation | Graduate School of Engineering Science, Osaka University |
| 4th Author's Name | Hitoshi KUBO |
| 4th Author's Affiliation | Graduate School of Engineering, Osaka University |
| 5th Author's Name | Masayuki ABE |
| 5th Author's Affiliation | Graduate School of Engineering, Osaka University |
| 6th Author's Name | Hideo ITOZAKI |
| 6th Author's Affiliation | Graduate School of Engineering Science, Osaka University |
| Date | 2009-01-29 |
| Paper # | SCE2008-33 |
| Volume (vol) | vol.108 |
| Number (no) | 420 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |