| Presentation | 2009-01-29 Improvement of uniformity for Bi-2212/MgO thin films fabricated by the MOD method with face-to-face annealing Koji Hamanaka, Takashi Tachiki, Takashi Uchida, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to apply the film to high frequency devices such as a terahertz oscillator and detector, we have been fabricating a Bi_2Sr_2CaCu_2O_<8+x>(Bi-2212) thin film on a MgO substrate by the metal-organic decomposition (MOD) method which has the advantages such as the absence of a vacuum system, low running cost and the ability to fabricate large-area films. However, we had a problem of non-uniformity of the film caused by a thermal decomposition of Bi-2212 when the film was annealed at 840℃. In this study, we introduced a face-to-face annealing of the precursor films, whose method was different from the conventional single substrate method, to improve the uniformity of a composition, and investigated the uniformity of the Bi-2212 thin film. The thermal decomposition of Bi-2212 was drastically suppressed by introducing the face-to-face annealing method. In a measurement of in-plane-orientation, a rotation angle of 45 deg against the MgO substrate was dominant. By improving the uniformity of the composition and in-plane-orientation, a critical current density at 4.2K of the film with the face-to-face annealing became one-order higher than that with the conventional single substrate method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Metal-organic decomposition (MOD) method / face-to-face annealing / Bi-2212 thin films / MgO substrate |
| Paper # | SCE2008-32 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2009/1/22(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvement of uniformity for Bi-2212/MgO thin films fabricated by the MOD method with face-to-face annealing |
| Sub Title (in English) | |
| Keyword(1) | Metal-organic decomposition (MOD) method |
| Keyword(2) | face-to-face annealing |
| Keyword(3) | Bi-2212 thin films |
| Keyword(4) | MgO substrate |
| 1st Author's Name | Koji Hamanaka |
| 1st Author's Affiliation | Department of Electrical and Electronic Engineering, National Defense Academy() |
| 2nd Author's Name | Takashi Tachiki |
| 2nd Author's Affiliation | Department of Electrical and Electronic Engineering, National Defense Academy |
| 3rd Author's Name | Takashi Uchida |
| 3rd Author's Affiliation | Department of Electrical and Electronic Engineering, National Defense Academy |
| Date | 2009-01-29 |
| Paper # | SCE2008-32 |
| Volume (vol) | vol.108 |
| Number (no) | 420 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |