| Presentation | 2008-12-12 A Test Generation Model for Threshold Testing Kenta SUTOH, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this study, we propose a test generation model for threshold testing. Using the proposed model, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show the effectiveness of the the proposed model. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | acceptable faults / test generation / threshold / circuit transformation |
| Paper # | DC2008-60 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/12/5(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Generation Model for Threshold Testing |
| Sub Title (in English) | |
| Keyword(1) | acceptable faults |
| Keyword(2) | test generation |
| Keyword(3) | threshold |
| Keyword(4) | circuit transformation |
| 1st Author's Name | Kenta SUTOH |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Yuki YOSHIKAWA |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2008-12-12 |
| Paper # | DC2008-60 |
| Volume (vol) | vol.108 |
| Number (no) | 352 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |