Presentation 2008-12-12
A Test Generation Model for Threshold Testing
Kenta SUTOH, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this study, we propose a test generation model for threshold testing. Using the proposed model, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show the effectiveness of the the proposed model.
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Keyword(in English) acceptable faults / test generation / threshold / circuit transformation
Paper # DC2008-60
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Committee DC
Conference Date 2008/12/5(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Test Generation Model for Threshold Testing
Sub Title (in English)
Keyword(1) acceptable faults
Keyword(2) test generation
Keyword(3) threshold
Keyword(4) circuit transformation
1st Author's Name Kenta SUTOH
1st Author's Affiliation Graduate School of Information Sciences, Hiroshima City University()
2nd Author's Name Yuki YOSHIKAWA
2nd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
Date 2008-12-12
Paper # DC2008-60
Volume (vol) vol.108
Number (no) 352
Page pp.pp.-
#Pages 6
Date of Issue