Presentation 2008-12-12
Optically Coupled Fail-safe Logic Gates
Daichi KUDO, Yuji HIRAO, Tetsuya KIMURA, Koichi FUTSUHARA,
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Abstract(in English) Optically coupled fail-safe logic gates are proposed in this paper. Whereas the conventional fail-safe logic gates based on dynamic processing adopt level transformation by boosted voltage to avoid the influence of input malfunction to output, the proposed gates apply photocouplers to enhance the electronic independence of logic gate components.
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Keyword(in English) Safety device / Fail-safe / Window Comparator / Optical Coupling / Photocoupler
Paper # DC2008-59
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Committee DC
Conference Date 2008/12/5(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optically Coupled Fail-safe Logic Gates
Sub Title (in English)
Keyword(1) Safety device
Keyword(2) Fail-safe
Keyword(3) Window Comparator
Keyword(4) Optical Coupling
Keyword(5) Photocoupler
1st Author's Name Daichi KUDO
1st Author's Affiliation Nagaoka University of Technology()
2nd Author's Name Yuji HIRAO
2nd Author's Affiliation Nagaoka University of Technology
3rd Author's Name Tetsuya KIMURA
3rd Author's Affiliation Nagaoka University of Technology
4th Author's Name Koichi FUTSUHARA
4th Author's Affiliation Nagaoka University of Technology
Date 2008-12-12
Paper # DC2008-59
Volume (vol) vol.108
Number (no) 352
Page pp.pp.-
#Pages 4
Date of Issue