| Presentation | 2008-11-17 Evaluating the reliability of Highly Reliable Cell Circuits Keiichi HOTTA, Takashi NAKADA, Masaki NAKANISHI, Shigeru YAMASHITA, Yasuhiko NAKASHIMA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, the shrinking process causes transistor variation and growth of error rate. Highly Reliable Cells (HRCs) have been proposed to solve these problems. We need to evaluate reliability of them quantitatively, because they are considered to be highly reliable. Although, there have been proposed several methods to evaluate the reliability, they cannot evaluate the reliability of circuits by HRCs accurately. Therefore, in this paper, we propose a new evaluation method for the reliability of circuits based on the fault probability of each transistor. The method can evaluate the reliablity of circuits by HRCs or the CMOS cells. The experimental results show that HRCs are more reliable than the CMOS cells. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | reliability evaluation / fault tolerance / transistor variation |
| Paper # | VLD2008-75,DC2008-43 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluating the reliability of Highly Reliable Cell Circuits |
| Sub Title (in English) | |
| Keyword(1) | reliability evaluation |
| Keyword(2) | fault tolerance |
| Keyword(3) | transistor variation |
| 1st Author's Name | Keiichi HOTTA |
| 1st Author's Affiliation | Nara Institute of Science and Technology() |
| 2nd Author's Name | Takashi NAKADA |
| 2nd Author's Affiliation | Nara Institute of Science and Technology |
| 3rd Author's Name | Masaki NAKANISHI |
| 3rd Author's Affiliation | Nara Institute of Science and Technology |
| 4th Author's Name | Shigeru YAMASHITA |
| 4th Author's Affiliation | Nara Institute of Science and Technology |
| 5th Author's Name | Yasuhiko NAKASHIMA |
| 5th Author's Affiliation | Nara Institute of Science and Technology |
| Date | 2008-11-17 |
| Paper # | VLD2008-75,DC2008-43 |
| Volume (vol) | vol.108 |
| Number (no) | 299 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |