Presentation | 2008-11-17 Scan-based Attack for an AES-LSI included with other IPs Ryuta NARA, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The threat of side-channel attacks against the cryptography LSI is indicated. Especially, scan-based attacks, which use the scan chain, are watched. Scan chains are one of the most important testing techniques, but it is possible to use for attacks against the cryptography LSI. Conventional scan-based attacks only consider the scan chain made by registers of cryptography circuits. However, cryptography LSI usually has many IPs such as memories, micro-processors and other circuits. Because of the real scan chain consists of many kinds of registers, it is obscure whether conventional scan-based attacks can attack or cannot. In this paper, scan-based attack which enables to crack the secret key in the AES-LSI with other IPs is proposed. By focusing the bit pattern of the specific register and monitoring its change, and our method eliminates the influence of other circuit registers. Therefore, our scan-based attacks don't depend on the architecture of the scan chain, and it can crack real cryptography LSIs included with other IPs. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Advanced Encryption Standard / AES / Side-channel attacks / Scan chain / Scan-based attack |
Paper # | VLD2008-68,DC2008-36 |
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Committee | DC |
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Conference Date | 2008/11/10(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Scan-based Attack for an AES-LSI included with other IPs |
Sub Title (in English) | |
Keyword(1) | Advanced Encryption Standard |
Keyword(2) | AES |
Keyword(3) | Side-channel attacks |
Keyword(4) | Scan chain |
Keyword(5) | Scan-based attack |
1st Author's Name | Ryuta NARA |
1st Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University() |
2nd Author's Name | Nozomu TOGAWA |
2nd Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University |
3rd Author's Name | Masao YANAGISAWA |
3rd Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University |
4th Author's Name | Tatsuo OHTSUKI |
4th Author's Affiliation | Grad. of Fundamental Science and Engineering, Waseda University |
Date | 2008-11-17 |
Paper # | VLD2008-68,DC2008-36 |
Volume (vol) | vol.108 |
Number (no) | 299 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |