Presentation 2008-11-17
Scan-based Attack for an AES-LSI included with other IPs
Ryuta NARA, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI,
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Abstract(in English) The threat of side-channel attacks against the cryptography LSI is indicated. Especially, scan-based attacks, which use the scan chain, are watched. Scan chains are one of the most important testing techniques, but it is possible to use for attacks against the cryptography LSI. Conventional scan-based attacks only consider the scan chain made by registers of cryptography circuits. However, cryptography LSI usually has many IPs such as memories, micro-processors and other circuits. Because of the real scan chain consists of many kinds of registers, it is obscure whether conventional scan-based attacks can attack or cannot. In this paper, scan-based attack which enables to crack the secret key in the AES-LSI with other IPs is proposed. By focusing the bit pattern of the specific register and monitoring its change, and our method eliminates the influence of other circuit registers. Therefore, our scan-based attacks don't depend on the architecture of the scan chain, and it can crack real cryptography LSIs included with other IPs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Advanced Encryption Standard / AES / Side-channel attacks / Scan chain / Scan-based attack
Paper # VLD2008-68,DC2008-36
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Committee DC
Conference Date 2008/11/10(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Scan-based Attack for an AES-LSI included with other IPs
Sub Title (in English)
Keyword(1) Advanced Encryption Standard
Keyword(2) AES
Keyword(3) Side-channel attacks
Keyword(4) Scan chain
Keyword(5) Scan-based attack
1st Author's Name Ryuta NARA
1st Author's Affiliation Grad. of Fundamental Science and Engineering, Waseda University()
2nd Author's Name Nozomu TOGAWA
2nd Author's Affiliation Grad. of Fundamental Science and Engineering, Waseda University
3rd Author's Name Masao YANAGISAWA
3rd Author's Affiliation Grad. of Fundamental Science and Engineering, Waseda University
4th Author's Name Tatsuo OHTSUKI
4th Author's Affiliation Grad. of Fundamental Science and Engineering, Waseda University
Date 2008-11-17
Paper # VLD2008-68,DC2008-36
Volume (vol) vol.108
Number (no) 299
Page pp.pp.-
#Pages 5
Date of Issue