| Presentation | 2008-11-17 Analysis of Open Faults using TEG Chip Toshiyuki TSUTSUMI, Yasuyuki KARIYA, Koji YAMAZAKI, Masaki HASHIZUME, Hiroyuki YOTSUYANAGI, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Yuzo TAKAMATSU, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The high integration of the semiconductor technology advances, and the fault detection and the failure diagnosis of LSI become difficult. Especially, a practicable modeling of an open fault has not been performed yet, though measures against the open fault become important more with advancement of LSI process technology. So, we have fabricated TEG (Test Element Group) chips into which open defects is intentionally built, and then we research on modeling the open fault based on the measurement data of the TEG chips. In this paper, the measurement data of the TEG chip is analyzed, and we report how influence a logical value of a faulty signal line with full open defect actually depend on those of the adjacent signal lines in the real chip. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | open faults / TEG chip / LSI testing / fault model |
| Paper # | VLD2008-63,DC2008-31 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of Open Faults using TEG Chip |
| Sub Title (in English) | |
| Keyword(1) | open faults |
| Keyword(2) | TEG chip |
| Keyword(3) | LSI testing |
| Keyword(4) | fault model |
| 1st Author's Name | Toshiyuki TSUTSUMI |
| 1st Author's Affiliation | Graduate School of Science and Technology, Meiji University() |
| 2nd Author's Name | Yasuyuki KARIYA |
| 2nd Author's Affiliation | Graduate School of Science and Technology, Meiji University |
| 3rd Author's Name | Koji YAMAZAKI |
| 3rd Author's Affiliation | School of Information and Communication, Meiji University |
| 4th Author's Name | Masaki HASHIZUME |
| 4th Author's Affiliation | Institute of Technology and Science, the University of Tokushima |
| 5th Author's Name | Hiroyuki YOTSUYANAGI |
| 5th Author's Affiliation | Institute of Technology and Science, the University of Tokushima |
| 6th Author's Name | Hiroshi TAKAHASHI |
| 6th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 7th Author's Name | Yoshinobu HIGAMI |
| 7th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 8th Author's Name | Yuzo TAKAMATSU |
| 8th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| Date | 2008-11-17 |
| Paper # | VLD2008-63,DC2008-31 |
| Volume (vol) | vol.108 |
| Number (no) | 299 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |