| Presentation | 2008-11-17 A Capture-Safe Test Generation Scheme for At-Speed Scan Testing Atsushi TAKASHIMA, Yuta YAMATO, Hiroshi FURUKAWA, Kohei MIYASE, Xiaoqing WEN, Seiji KAJIHARA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Capture-safety, defined as the avoidance of any timing error due to unduly high switching activity in capture mode during at-speed scan testing, is critical for avoiding test-induced yield loss. Although point techniques are available for reducing capture IR-drop, there is a lack of complete capture-safe test generation flows. The paper addresses this problem by proposing a novel and practical capture-safe test generation scheme, featuring (1) reliable capture-safety checking and (2) effective capture-safety improvement by combining X-bit identification & X-filling with low launch-switching-activity test generation. This scheme is compatible with existing ATPG flows, and achieves capture-safety with no changes to the circuit-under-test or the clocking scheme. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | At-Speed Scan Test / Capture-Safety / Capture-Safety Check / X-Identification / X-Filling |
| Paper # | VLD2008-62,DC2008-30 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing |
| Sub Title (in English) | |
| Keyword(1) | At-Speed Scan Test |
| Keyword(2) | Capture-Safety |
| Keyword(3) | Capture-Safety Check |
| Keyword(4) | X-Identification |
| Keyword(5) | X-Filling |
| 1st Author's Name | Atsushi TAKASHIMA |
| 1st Author's Affiliation | Dept of CSE, Kyushu Institute of Technology() |
| 2nd Author's Name | Yuta YAMATO |
| 2nd Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 3rd Author's Name | Hiroshi FURUKAWA |
| 3rd Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 4th Author's Name | Kohei MIYASE |
| 4th Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 5th Author's Name | Xiaoqing WEN |
| 5th Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 6th Author's Name | Seiji KAJIHARA |
| 6th Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| Date | 2008-11-17 |
| Paper # | VLD2008-62,DC2008-30 |
| Volume (vol) | vol.108 |
| Number (no) | 299 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |