| Presentation | 2008-11-17 An Integer Programming Formulation for Generating High Quality Transition Tests Tsuyoshi IWAGAKI, Mineo KANEKO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper describes a test generation method to derive high quality transition tests for combinational circuits. It is known that, for a transition fault, two-pattern tests which propagate the errors to all the primary outputs reachable from the fault site can enhance the detectability of unmodeled defects. In this paper, to generate high quality transition tests, the test generation problem is formulated as a problem of integer linear programming, where a metric expressing the above fact is optimized. The proposed formulation guarantees that minimum two-pattern tests for a transition fault are generated such that the errors are observed at all the primary outputs reachable from the fault site. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | combinational circuit / test generation / high quality transition test / integer linear programming / minimum test set |
| Paper # | VLD2008-61,DC2008-29 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Integer Programming Formulation for Generating High Quality Transition Tests |
| Sub Title (in English) | |
| Keyword(1) | combinational circuit |
| Keyword(2) | test generation |
| Keyword(3) | high quality transition test |
| Keyword(4) | integer linear programming |
| Keyword(5) | minimum test set |
| 1st Author's Name | Tsuyoshi IWAGAKI |
| 1st Author's Affiliation | School of Information Science, Japan Advanced Institute of Science and Technology (JAIST)() |
| 2nd Author's Name | Mineo KANEKO |
| 2nd Author's Affiliation | School of Information Science, Japan Advanced Institute of Science and Technology (JAIST) |
| Date | 2008-11-17 |
| Paper # | VLD2008-61,DC2008-29 |
| Volume (vol) | vol.108 |
| Number (no) | 299 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |