| Presentation | 2008-11-17 On Improving Transition Fault Coverage of Stuck-at Fault Tests Using Don't Care Identification Technique Kazumitsu HAMASAKI, Toshinori HOSOKAWA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent year, transition fault testing and/or bridging fault testing for VLSIs are increasingly required in addition to stuck-at fault testing because the number of gates on VLSIs is rapidly increasing and their complexity is growing with advances in semiconductor technology. However, additional test patterns to detect fault models other than stuck-at fault cause the increase of testing cost. In this paper, we propose a method to generate a modified test set that not only guarantees to detect stuck-at faults but also detects as many as possible transition faults by applying don't care identification techniques to a given stuck-at test set. Therefore, there are no negative impacts on testing cost. Experimental results for ITC'99 benchmark circuits show that the modified test sets obtained by the proposed method detect more transition faults from 27% than the test sets initially generated for stuck-at faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | don't care / skewed load / transition fault / reverse shifting |
| Paper # | VLD2008-60,DC2008-28 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Improving Transition Fault Coverage of Stuck-at Fault Tests Using Don't Care Identification Technique |
| Sub Title (in English) | |
| Keyword(1) | don't care |
| Keyword(2) | skewed load |
| Keyword(3) | transition fault |
| Keyword(4) | reverse shifting |
| 1st Author's Name | Kazumitsu HAMASAKI |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| Date | 2008-11-17 |
| Paper # | VLD2008-60,DC2008-28 |
| Volume (vol) | vol.108 |
| Number (no) | 299 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |