Presentation | 2008-11-15 Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts Terutaka Tamai, Shigeru Sawada, Yasuhiro Hattori, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Tin and its alloy have been applied to electrical contacts for low electrical conditions. Particularly, tin plated contacts are used widely to connector contacts for automotives. In the relationship between contact resistance (R) and increasing contact load (W) for both solid and plated tin, singularity characteristics were found. Well known deformation theories of the contact interfaces can not explain this singularity characteristic. This is very important for contact application. In this study, in order to clarify this singular characteristic, and to obtain a contact model explaining this phenomenon, contact traces for each contact load were examined by using SEM and STM. Obtained microscopic images indicated growth of piling-up of periphery of true contact area for both solid and plated tin. The sinking-in of tin surface forms piling-up around the periphery of the contact trace. In this deformation process, since the periphery of indented contact area severely slides against surface side of the platinum probe, contact resistance sharply decreases with W^<-2> characteristics. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | connector / tin contacts / tin plating / contact resistance / contact area |
Paper # | EMD2008-78 |
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Conference Information | |
Committee | EMD |
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Conference Date | 2008/11/8(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electromechanical Devices (EMD) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts |
Sub Title (in English) | |
Keyword(1) | connector |
Keyword(2) | tin contacts |
Keyword(3) | tin plating |
Keyword(4) | contact resistance |
Keyword(5) | contact area |
1st Author's Name | Terutaka Tamai |
1st Author's Affiliation | Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology() |
2nd Author's Name | Shigeru Sawada |
2nd Author's Affiliation | Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology |
3rd Author's Name | Yasuhiro Hattori |
3rd Author's Affiliation | AutoNetworks Technology, Ltd. |
Date | 2008-11-15 |
Paper # | EMD2008-78 |
Volume (vol) | vol.108 |
Number (no) | 296 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |