Presentation 2008-11-15
Study on A Novel Method of Accelerated Life Test for Relay Reliability
Shujuan WANG, Qiong YU, Li REN,
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Abstract(in English) Electrical life is an important parameter to estimate the reliability of relay. Non-closing and Non-opening caused by arc erosion and/or material transfer are two primary contact failure modes in relay. Load current has great influence on the two modes and the life of relay. In this paper, load current stress accelerated life tests were carried out by a life test system designed for relay. During life test, the characteristic parameters such as contact resistance, closing time and opening time of the relay were measured for each operation to identify if the relay samples failed or not, thus the mechanisms and the modes of contact failures were determined. In addition, A Weibull statistical analysis was adopted to check the consistency of failure mechanisms under different load current stress. Finally, a statistical model for estimating the life during DC load current stress and investigating the acceleration factors of high current stresses was built.
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Keyword(in English) Relays / Accelerated life test / Load current stress / Reliability estimation
Paper # EMD2008-75
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Conference Information
Committee EMD
Conference Date 2008/11/8(1days)
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Paper Information
Registration To Electromechanical Devices (EMD)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on A Novel Method of Accelerated Life Test for Relay Reliability
Sub Title (in English)
Keyword(1) Relays
Keyword(2) Accelerated life test
Keyword(3) Load current stress
Keyword(4) Reliability estimation
1st Author's Name Shujuan WANG
1st Author's Affiliation School of Electrical Engineering and Automation, Harbin Institute of Technology()
2nd Author's Name Qiong YU
2nd Author's Affiliation School of Electrical Engineering and Automation, Harbin Institute of Technology
3rd Author's Name Li REN
3rd Author's Affiliation School of Electrical Engineering and Automation, Harbin Institute of Technology
Date 2008-11-15
Paper # EMD2008-75
Volume (vol) vol.108
Number (no) 296
Page pp.pp.-
#Pages 4
Date of Issue